Semiconductor Wafer Flash Heating With Staged Temperature Ramps
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Solution Overview
Problem
Existing flash lamp annealing methods face challenges in achieving high activation of impurities while minimizing thermal history, especially for new materials like germanium and 3-D semiconductor devices, where excessive thermal effects can deteriorate device properties.
Innovation Solution
A method involving two-stage light irradiation, where a substrate is first preheated using continuous halogen lamps to a lower temperature, followed by flash lamp irradiation in multiple stages to rapidly increase the surface temperature to a treatment temperature, thereby reducing the overall heat input and thermal history.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If flash lamp annealing is used to activate impurities, then activation efficiency is improved, but thermal history increases causing deep diffusion of impurities
Solution Approach 1:
The heating process is segmented into multiple stages: preheating stage using halogen lamps to reach a base temperature, followed by multiple flash lamp irradiation stages (first flash, second flash) to progressively reach the target temperature. This segmentation allows controlled temperature increase while minimizing excessive thermal diffusion.
Solution Approach 2:
The substrate is preheated to a predetermined temperature using halogen lamps before flash lamp irradiation is applied. This preliminary action reduces the temperature differential required during flash heating, thereby reducing the thermal history and preventing excessive diffusion of impurities.
2Temperature
If preheating is performed using halogen lamps, then the substrate reaches a stable base temperature, but the heating time becomes excessively long
Solution Approach 1:
The heating process uses periodic flash lamp irradiation interspersed with intervals, rather than continuous heating. The flash lamps provide intense periodic heating bursts that efficiently raise the temperature from the preheated base state to the target temperature, significantly reducing total heating time compared to continuous halogen lamp heating.
3Loss of time
If flash lamp irradiation is applied directly without preheating, then heating time is reduced, but the surface temperature cannot reach the target temperature
Solution Approach 1:
The substrate is preheated to a predetermined temperature using halogen lamps before flash lamp irradiation is applied. This preliminary action reduces the temperature differential required during flash heating, thereby reducing the thermal history and preventing excessive diffusion of impurities.
4Manufacturing precision
If flash lamp annealing is used for new materials like germanium, then high carrier mobility is achieved, but excessive thermal effects cause material degradation
Solution Approach 1:
The heating process is segmented into multiple stages: preheating stage using halogen lamps to reach a base temperature, followed by multiple flash lamp irradiation stages (first flash, second flash) to progressively reach the target temperature. This segmentation allows controlled temperature increase while minimizing excessive thermal diffusion.
Solution Approach 2:
The substrate is preheated to a predetermined temperature using halogen lamps before flash lamp irradiation is applied. This preliminary action reduces the temperature differential required during flash heating, thereby reducing the thermal history and preventing excessive diffusion of impurities.
5Manufacturing precision
If flash lamp annealing is used for 3-D devices, then activation of upper layer is improved, but thermal effects deteriorate lower layer properties
Solution Approach 1:
The heating process is segmented into multiple stages: preheating stage using halogen lamps to reach a base temperature, followed by multiple flash lamp irradiation stages (first flash, second flash) to progressively reach the target temperature. This segmentation allows controlled temperature increase while minimizing excessive thermal diffusion.
Solution Approach 2:
The substrate is preheated to a predetermined temperature using halogen lamps before flash lamp irradiation is applied. This preliminary action reduces the temperature differential required during flash heating, thereby reducing the thermal history and preventing excessive diffusion of impurities.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively reduces the amount of heat given to the substrate, allowing for higher activation of impurities with reduced diffusion, while preventing excessive thermal effects on existing layers in 3-D devices.
Implementation Method 1
irradiating the substrate with light from a continuous lighting lamp to heat the substrate
Implementation Method 2
irradiating a front surface of the substrate with a flash of light from a flash lamp to increase the temperature of the front surface in multiple stages
Data Source
AI summary
A semiconductor wafer is preheated to a predetermined preheating temperature. Thereafter, flash heating for heating a front surface of the semiconductor wafer is performed by irradiating the front surface with flashes of light. The flash heating includes a first flash heating process in which the temperature of the front surface of the semiconductor wafer is increased at a first temperature increase rate, and a second flash heating process in which the temperature of the front surface of the semiconductor wafer is increased at a second temperature increase rate higher than the first temperature increase rate. The preheating temperature is made lower than a reaction temperature, and a shortage of the preheating is compensated for by the first flash heating process. Finally, the second flash heating process increases the temperature of the front surface of the semiconductor wafer to a target treatment temperature.


