Wafer-Grade LED Detection Device Optical Filtering
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Solution Overview
Problem
Conventional LED detection devices and methods are inadequate for enhancing color performance and efficiency in full-color LED display devices, particularly in detecting relevant information such as wavelength range, brightness, and leakage current from LED wafers.
Innovation Solution
A wafer-grade LED detection device and method involving a light-generating module, a light-filtering module, and a light-detecting module, where the first light beam is converted into a second beam passing through the LED wafer, then filtered and detected, allowing for the restriction of wavelength range and detection of specific characteristics like wavelength range, brightness, and leakage current.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional LED detection devices are used, then detection of LED wafer characteristics is possible, but the detection precision and accuracy for wavelength range, brightness, and leakage current are insufficient
Solution Approach 1:
The detection device is divided into multiple functional modules: a light-generating module that provides incident light, an LED wafer under test, a light-filtering module with specific wavelength filters, and a light-detecting module. This segmentation allows each module to perform its specific function optimally, improving overall detection precision for wavelength range, brightness, and leakage current characteristics
Solution Approach 2:
The light-filtering module acts as an intermediary between the LED wafer and the light-detecting module. It contains filters that selectively transmit specific wavelength ranges, enabling precise measurement of the LED's emission characteristics while blocking unwanted wavelengths, thus improving measurement accuracy without requiring complex detection electronics
2Loss of information
If conventional LED detection methods are used, then basic LED performance can be assessed, but accurate detection of wavelength range, brightness, and leakage current from LED wafers cannot be achieved
Solution Approach 1:
The light-filtering module is pre-configured with specific wavelength filters before the detection process begins. This preliminary setup ensures that only the relevant wavelength ranges reach the detector, allowing accurate extraction of wavelength range, brightness, and leakage current information from the LED wafer without requiring complex real-time processing
Solution Approach 2:
The invention replaces complex electronic detection methods with an optical-based detection system. By using optical filters and a light detector, the system can simultaneously obtain multiple parameters (wavelength range, brightness, leakage current) through optical measurements, improving information detection accuracy while maintaining high detection efficiency
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of wavelength range, brightness, and leakage current of LED wafers, improving the assessment and performance of LED display devices by optimizing the optical path and module configuration.
Implementation Method 1
a light-generating module providing a first light beam L1 that passes through an LED wafer W to be converted into a second light beam L2
Implementation Method 2
a light-filtering module L2 for receiving the second light beam L2 that passes through the light-filtering module L2 to be converted into a third light beam L3
Implementation Method 3
a wavelength range of the second light beam L2 is restricted by the light-filtering module L2, so that a wavelength range of the third light beam L3 is smaller than the wavelength range of the second light beam L2
Implementation Method 4
a light-detecting module L3 for receiving the third light beam L3 and detecting the third light beam L3
Data Source
AI summary
A wafer-grade LED detection device and a wafer-grade LED detection method are provided. The wafer-grade LED detection device includes a light-generating module for providing a first light beam that passes through an LED wafer to be converted into a second light beam, a light-filtering module adjacent to the LED wafer for receiving the second light beam that passes through the light-filtering module to be converted into a third light beam, and a light-detecting module adjacent to the light-filtering module for receiving and detecting the third light beam. A wavelength range of the second light beam is restricted by the light-filtering module, so that a wavelength range of the third light beam is smaller than the wavelength range of the second light beam. When the third light beam is received by the light-detecting module, the light-detecting module can detect the third light beam for obtaining relevant information.