Wafer inspection apparatus
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Solution Overview
Problem
Wafer inspection apparatuses with multiple inspection parts arranged in a height and width direction face space constraints and complexity due to the need for multiple fan filter units and control systems.
Innovation Solution
A wafer inspection apparatus with air circulating means at both ends of a longitudinal air circulating region, which efficiently circulates air and maintains cleanliness while reducing space requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If fan filter units are installed in each inspection part, then cleanliness of the inspection part is maintained, but installation space increases and device complexity increases
Solution Approach 1:
Multiple fan filter units are merged into a single air circulating means that is shared across all inspection parts. The air circulating means includes a fan and filter unit that circulates air through all inspection parts collectively, eliminating the need for separate control systems for each individual fan filter unit while maintaining cleanliness in all inspection areas.
Solution Approach 2:
The air circulating means is designed as a universal system that serves multiple inspection parts simultaneously. This single air circulating means performs the function of multiple individual fan filter units by circulating air through all inspection parts, reducing both the number of components and control systems required.
2Object-affected harmful factors
If fan filter units are installed in each inspection part, then cleanliness of the inspection part is maintained, but installation space increases
Solution Approach 1:
Multiple fan filter units are merged into a single air circulating means that is shared across all inspection parts. The air circulating means includes a fan and filter unit that circulates air through all inspection parts collectively, eliminating the need for separate control systems for each individual fan filter unit while maintaining cleanliness in all inspection areas.
Solution Approach 2:
The air circulating means is designed as a universal system that serves multiple inspection parts simultaneously. This single air circulating means performs the function of multiple individual fan filter units by circulating air through all inspection parts, reducing both the number of components and control systems required.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution effectively maintains cleanliness and reduces space usage in wafer inspection apparatuses with multiple inspection parts, enhancing inspection efficiency and simplicity.
Implementation Method 1
a pair of air circulating means disposed at both ends in a longitudinal direction of an air circulating region including the plurality of inspection parts arranged in the lateral direction and configured to circulate air in the circulating region
Data Source
AI summary
A wafer inspection apparatus according to one embodiment is a wafer inspection apparatus including a plurality of inspection parts arranged in a height direction and a lateral direction, and includes a pair of air circulating means disposed at both ends in a longitudinal direction of an air circulating region including the plurality of inspection parts arranged in the lateral direction and configured to circulate air in the circulating region.


