Wafer Pickup Position Tracking for Mounting Failure Prevention
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Solution Overview
Problem
Existing information management devices in mounting systems fail to effectively manage information to quickly identify and prevent component failures before inspection results are available, leading to potential reoccurrence of failures during the mounting process.
Innovation Solution
An information management device that acquires and stores pickup position information and usability determination results, allowing for the association of these data points to identify trends and prevent further failures by skipping unusable components and tracking neighborhood components for quality control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If inspection results are used to identify failed components, then failure identification accuracy is improved, but response time is worsened due to waiting for inspection results
Solution Approach 1:
The system performs preliminary actions by acquiring and storing pickup position information and usability determination results immediately after component pickup, before the component is mounted and before inspection is completed. This allows the system to proactively identify potentially failed components and skip them from further mounting, rather than waiting for inspection results to arrive after mounting has already occurred.
2Productivity
If all picked up components are mounted on base material, then productivity is improved, but quality is worsened due to potential failure propagation
Solution Approach 1:
The system establishes a feedback mechanism where usability determination results are continuously acquired and stored in association with pickup position information. This feedback loop allows the system to identify components with usability issues and automatically skip them from mounting, preventing defective components from being propagated to the final product while maintaining high mounting throughput for good components.
Solution Approach 2:
The system extracts and removes components determined to be unusable from the mounting process by skipping them. Instead of mounting all picked-up components, the system identifies and extracts defective components based on usability determination results, preventing them from entering the final product while allowing healthy components to proceed with mounting at high speed.
3Measurement precision
If pickup position information is stored and analyzed, then failure pattern recognition is improved, but information processing complexity is worsened
Solution Approach 1:
The system segments information processing by dividing it into distinct functional modules: pickup position information acquisition, usability determination result acquisition, association processing, and storage. This segmentation allows the complex task of failure pattern recognition to be broken down into manageable steps, reducing overall system complexity while maintaining the capability to analyze failure patterns through stored position and result data.
Data Source
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AI summary
An information management device for managing information in a mounting system that mounts a component after determining usability of the component when the component is picked up from a wafer divided into multiple components and is mounted on a base material, includes an information storage section that stores various types of information, an information acquisition section that acquires information on a pickup position of the component on the wafer and information on a determination result of usability of the component, and an information processing section that stores information obtained by associating the pickup position of the component with the determination result of the usability in the information storage section