Resin Film Application on Semiconductor Wafer Frame Cleaning

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Solution Overview

Problem

The existing method for applying a resin film to a semiconductor wafer during laser dicing often results in solution scattering and adhering to the frame, causing issues with detachment from vacuum transport pads due to tackiness.

Innovation Solution

A method that includes supplying liquid droplets of resin solution to the semiconductor wafer, spreading them using a rotating chuck, and subsequently cleaning the frame surface with a cleaning fluid to prevent solution adherence.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If the chuck means is rotated at a high speed to spread liquid droplets, then the resin solution is effectively spread throughout the face of the semiconductor wafer, but the solution scatters and adheres to the surface of the frame

Engineering Contradiction:
Improveresin film uniformityVSAvoidsolution scattering
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent extracts and removes the scattered solution from the frame surface using a cleaning fluid supply means. The cleaning fluid is supplied to the frame surface to dissolve and remove the adhered resin solution, preventing contamination and ensuring clean processing.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces a cleaning fluid as an intermediary substance to mediate between the scattered solution and the frame surface. The cleaning fluid acts as a mediator that dissolves the adhered solution and facilitates its removal, preventing direct contamination of the frame.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If the solution adheres to the frame surface, then the assembly cannot be detached from the vacuum pad due to tackiness, but the vacuum pad is needed for transport

Engineering Contradiction:
Improvetransport stabilityVSAvoiddetachment difficulty
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent performs preliminary cleaning action by supplying cleaning fluid to the frame surface before the detachment process. This preliminary cleaning removes the tacky solution from the frame surface, preventing it from interfering with the subsequent vacuum pad detachment operation.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent rushes through the potential problem by quickly removing the scattered solution through cleaning fluid supply. This prevents the solution from adhering and causing detachment issues, allowing the process to move quickly to the next step without interruption.

Inventive Principle:
Principle #21Skipping (Rushing through)

3Ease of manufacture

If liquid droplets are supplied to the central portion of the semiconductor wafer, then the resin coating can be applied, but the solution scatters over the frame surface during rotation

Engineering Contradiction:
Improvecoating simplicityVSAvoidframe contamination
Core Design Contradiction:
Ease of manufactureVSObject-generated harmful factors

Solution Approach 1:

The patent converts the harmful scattered solution into a removable substance by introducing cleaning fluid. The cleaning fluid transforms the contamination problem into a solvable issue by dissolving and removing the scattered solution, turning a harmful effect into a manageable process step.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent changes the physical state and properties of the scattered solution by introducing cleaning fluid with different chemical properties. The cleaning fluid alters the parameters of the adhered solution, making it soluble and removable, thus converting a persistent contamination into a removable residue.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Ensures effective detachment of the semiconductor wafer assembly from transport pads by removing adhered solution, preventing sticking and facilitating smooth transport.

Implementation Method 1

the chuck means is rotated at a high speed, whereby the liquid droplets are spread throughout the face of the semiconductor wafer

Methodology Applied
Scientific EffectCentrifugal force: Centrifugal Force

Implementation Method 2

The pad is pressed against the surface of the frame to attract the assembly under vacuum

Methodology Applied
Scientific EffectVacuum: Vacuum

Data Source

PatentUS7799700B2Method for applying resin film to face of semiconductor wafer
Publication Date: 2010.09.21 DISCO CORP
  • US7799700B2 patent drawing
  • US7799700B2 patent drawing
  • US7799700B2 patent drawing

AI summary

A method for applying a resin film to the face of a semiconductor wafer, comprising: an assembly holding step of holding an assembly on the surface of chuck means, with the back of the assembly being opposed to the surface of the chuck means, the assembly including a frame having a mounting opening formed in a central portion of the frame, and a semiconductor wafer mounted in the mounting opening of the frame by sticking a mounting tape to the back of the frame and the back of the semiconductor wafer; a liquid droplet supply step of supplying liquid droplets of a solution having a resin dissolved therein onto the face of the semiconductor wafer in the assembly after the assembly holding step; and a spreading step of rotating the chuck means subsequently to the liquid droplet supply step, thereby spreading the liquid droplets throughout the face of the semiconductor wafer. The method further comprises a cleaning step of rotating the chuck means and also supplying a cleaning fluid to the surface of the frame after the spreading step, thereby cleaning the solution which has adhered to the surface of the frame.