Wafer Temperature Sensor Calibration Liquid Bath

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Solution Overview

Problem

Conventional temperature sensor calibration systems face limitations in accuracy due to vertical thermal gradients and lower production throughput, as sensors are calibrated after packaging, leading to increased costs and reduced calibration efficiency.

Innovation Solution

A system and method for calibrating temperature sensors on a wafer by submerging the wafer in a liquid bath with a temperature controller, using a horizontal configuration to minimize thermal gradients and an electrical connection mechanism for signal reception, allowing for precise calibration of sensors before packaging.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If IC sensors are packaged before calibration, then the sensors are protected and easier to handle, but the calibration accuracy decreases due to vertical thermal gradients and production throughput decreases

Engineering Contradiction:
Improveease of handlingVSAvoidcalibration accuracy
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent performs calibration on the wafer before dicing and packaging the sensors. By conducting calibration at the wafer level prior to packaging, the system eliminates the thermal gradient issues that arise when packaged sensors are immersed in liquid baths, thereby maintaining high calibration accuracy while still enabling easy handling through subsequent packaging

Inventive Principle:
Principle #10Preliminary action

2Ease of manufacture

If IC sensors are packaged before calibration, then the sensors are protected, but the production throughput decreases due to larger physical size requiring more processing time

Engineering Contradiction:
Improveease of handlingVSAvoidproduction throughput
Core Design Contradiction:
Ease of manufactureVSProductivity

Solution Approach 1:

The patent performs calibration on the wafer before dicing and packaging the sensors. By conducting calibration at the wafer level prior to packaging, the system eliminates the thermal gradient issues that arise when packaged sensors are immersed in liquid baths, thereby maintaining high calibration accuracy while still enabling easy handling through subsequent packaging

Inventive Principle:
Principle #10Preliminary action

3Ease of operation

If boards are mounted vertically in liquid bath, then the setup is simple, but the calibration accuracy decreases due to vertical thermal gradient

Engineering Contradiction:
Improvesetup simplicityVSAvoidcalibration accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent performs calibration on the wafer before dicing and packaging the sensors. By conducting calibration at the wafer level prior to packaging, the system eliminates the thermal gradient issues that arise when packaged sensors are immersed in liquid baths, thereby maintaining high calibration accuracy while still enabling easy handling through subsequent packaging

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances calibration accuracy and reduces costs by enabling more efficient calibration of sensors in a wafer format, improving production throughput and accuracy while minimizing thermal gradient effects.

Implementation Method 1

a liquid bath with a temperature controller, using a horizontal configuration to minimize thermal gradients

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentUS9927308B1Temperature sensor calibration of an entire wafer in a liquid bath
Publication Date: 2018.03.27 MAXIM INTEGRATED PROD INC
  • US9927308B1 patent drawing
  • US9927308B1 patent drawing
  • US9927308B1 patent drawing

AI summary

A system for calibrating sensors in a wafer is provided. The system includes a container for containing liquid and configured to accommodate the wafer in the liquid; a temperature controller for controlling a temperature of the liquid; and an electrical connection mechanism for receiving electrical signals to the sensors when the temperature of the liquid reaches a preset level during operation. The system also includes a device that receives the signals from the sensors and calibrates the sensors based on the temperature of the liquid and the received signals from the sensors.