Wafer Transfer Adhesive Layer Selective Etching

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Solution Overview

Problem

In microelectronics, transferring thin layers with surface topology poses challenges due to variations in height, making it difficult to bond wafers effectively and requiring additional lithography and etching operations to reopen contact pads, which are not always compatible with the permanent support and can damage the layer's topology.

Innovation Solution

A method involving the deposition of an adhesive layer and a first barrier layer with selective etching properties, allowing for the transfer and processing of thin layers with surface topology, including the use of multiple barrier layers to protect the surface and facilitate the removal of the adhesive layers without damaging the layer, enabling the reopening of contact pads without lithography operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If bonding is performed directly on the processed surface with topology variations, then the transfer process is simplified, but bonding quality deteriorates due to height differences between raised and low areas

Engineering Contradiction:
Improvetransfer process complexityVSAvoidbonding interface flatness
Core Design Contradiction:
Device complexityVSManufacturing precision

Solution Approach 1:

The patent introduces an intermediary bonding layer deposited on the processed surface before bonding to the permanent support. This layer acts as a mediator that compensates for topology variations, providing a flat bonding interface while maintaining the underlying circuit structure. The intermediary layer is subsequently removed through selective etching to restore contact pad access.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent performs preliminary deposition of the bonding layer and flattening operations before the actual bonding process. This preliminary action creates a flat surface for bonding while preserving the topology information, allowing subsequent selective removal to restore original features without requiring complex lithography operations.

Inventive Principle:
Principle #10Preliminary action

2Ease of operation

If additional lithography and etching operations are performed to reopen contact pads, then contact pad access is restored, but the process complexity increases and compatibility with permanent support is reduced

Engineering Contradiction:
Improvecontact pad accessVSAvoidlithography and etching operations
Core Design Contradiction:
Ease of operationVSDevice complexity

Solution Approach 1:

The patent extracts the bonding layer material specifically from regions corresponding to contact pads through selective etching. This extraction is guided by the topology preserved during bonding, allowing direct access to contact pads without requiring lithography masks or additional patterning steps. The bonding layer serves as a self-aligned mask that is removed only where needed.

Inventive Principle:
Principle #2Taking out (Extraction)

3Manufacturing precision

If the processed surface is buried at the bonding interface to ensure flat bonding, then bonding quality improves, but the surface must be returned upward through double transfer

Engineering Contradiction:
Improvebonding interface flatnessVSAvoidtransfer process efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent uses an intermediary bonding layer that is deposited, bonded, and then selectively removed. This intermediary layer enables the surface to be temporarily buried for flat bonding while providing a controlled removal mechanism that restores surface access efficiently, avoiding the need for complex double transfer operations.

Inventive Principle:
Principle #24Intermediary (Mediator)

4Strength

If adhesive substance is used to bond wafers, then bonding is achieved, but the adhesive may interfere with transfer or require subsequent elimination

Engineering Contradiction:
Improvebonding strengthVSAvoidadhesive interference with transfer
Core Design Contradiction:
StrengthVSObject-generated harmful factors

Solution Approach 1:

The patent changes the material parameter of the bonding layer from adhesive substances to deposited materials such as oxides or nitrides. These materials provide sufficient bonding strength while being compatible with the subsequent selective etching process, eliminating the harmful effects associated with adhesive substances that would interfere with transfer or require elimination.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method allows for the successful transfer and processing of thin layers with surface topology, maintaining the initial layer topology and enabling the reopening of contact pads without additional lithography operations, thus simplifying the transfer process and reducing the risk of damage to the layer.

Implementation Method 1

Bonding of wafers to one another may, for example, be done using bonding by molecular adhesion

Methodology Applied
Scientific EffectMolecular adhesion: Adhesive

Implementation Method 2

the adhesive layer being made of a material of which etching presents selectivity in relation to the material of the barrier layer, meaning of which the etch rate is higher than that of the barrier layer

Methodology Applied
Scientific EffectSelective etching:

Data Source

PatentUS7807482B2Method for transferring wafers
Publication Date: 2010.10.05 SOITEC SA
  • US7807482B2 patent drawing
  • US7807482B2 patent drawing
  • US7807482B2 patent drawing

AI summary

The invention concerns a method for preparing a thin layer (28) or a chip to be transferred onto another substrate, this method including the realization, above the surface of said thin layer or said chip, of at least one layer, called adhesive layer (25), and of at least one layer, called first barrier layer (22), the adhesive layer being made of a material of which etching presents selectivity in relation to the material of the barrier layer.