High-Speed Wave Front Measurement for Dynamic Eye Aberration
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Solution Overview
Problem
Current wave front detection systems for determining eye aberration are limited in their ability to provide fast and dynamic measurements, especially in dynamic visual situations, and fail to comprehensively analyze accommodation processes and chromatic aberration.
Innovation Solution
A device comprising a radiation source and a sensor system that scans wave fronts at a frequency matching the frequency of changes in the eye's wave fronts, using a CMOS sensor with amplification and multiple wavelengths, and a stimulus-generating device to analyze dynamic changes, allowing for accurate measurement of aberrations and chromatic aberration under various conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If conventional Hartmann Shack sensors are used for wave front measurement, then wave front aberration can be measured, but the measurement speed is insufficient for dynamic visual situations
Solution Approach 1:
The patent applies dynamics by using a CMOS sensor capable of high-speed scanning (at least 70 Hz, preferably 100 Hz or more) to capture wave front changes in real-time during dynamic visual situations. This allows the system to track accommodation processes and chromatic aberration variations as they occur, transforming the measurement system from static to dynamic capability.
Solution Approach 2:
The patent changes the scanning frequency parameter to match or exceed the frequency of wave front changes (at least equal in size to the frequency at which changes in wave fronts occur). This parameter adjustment enables the system to capture fast dynamic changes in the eye's lens during accommodation while maintaining measurement precision through synchronized high-speed detection.
2Productivity
If high scanning frequency is used to capture dynamic changes, then accommodation processes can be analyzed, but device complexity increases
Solution Approach 1:
The patent replaces complex mechanical scanning systems with a high-speed CMOS electronic sensor that can capture wave front changes at frequencies of at least 70 Hz, preferably 100 Hz or more. This electronic substitution eliminates the need for moving mechanical parts while achieving the required scanning speed, thereby reducing device complexity despite the high productivity requirement.
3Measurement precision
If multiple wavelengths are used to measure chromatic aberration, then comprehensive optical properties can be determined, but measurement time increases
Solution Approach 1:
The patent implements continuous wave front measurement at high scanning frequencies (at least 70 Hz, preferably 100 Hz or more) that simultaneously captures data for multiple wavelengths. This continuous high-speed measurement allows chromatic aberration to be determined across different wavelengths without sequential measurement delays, eliminating time loss while maintaining comprehensive optical property analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise and comprehensive measurement of wave fronts, including dynamic accommodation processes and chromatic aberration, with high scanning frequencies and multiple wavelengths, improving the understanding of optical properties of lenses and eyes.
Implementation Method 1
a sensor device to detect wave fronts in test radiation reaching the sensor device and resulting from the test radiation of the radiation source after interaction with the lens
Data Source
AI summary
Device for measuring wave fronts generated by a lens (4) for an eye, with a radiation source (14) for emitting test radiation (12) to be directed at the lens (4) and a sensor device (26) for detecting wave fronts of incident test radiation after interaction with the lens, wherein the sensor device scans the test radiation (20) after interaction with the lens (4) at a scanning frequency which is at least equal in size to the frequency at which changes in wave fronts occur in the test radiation (20) after interaction with the lens (4).