Semiconductor Test Apparatus Waveform Acquisition Memory Switching
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Solution Overview
Problem
Conventional semiconductor test apparatuses cannot perform function tests and DC tests in parallel, limiting the ability to measure power supply voltage and current waveforms over long periods, requiring additional hardware like oscilloscopes and restricting data acquisition time.
Innovation Solution
A waveform data acquisition module that includes multiple channels of capture units with A/D converters, memory units, and a memory controller to continuously write and switch digital signals between memory units, allowing for efficient long-term data acquisition of power supply current and voltage waveforms without the need for additional hardware.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If conventional semiconductor test apparatus is used, then function test can be performed, but DC test and waveform measurement cannot be performed in parallel, requiring additional hardware and limiting data acquisition time
Solution Approach 1:
The patent combines the waveform measurement function and DC test function into a single integrated test apparatus. The waveform measurement unit with multi-channel A/D converters and the DC test unit share common hardware resources including the device under test interface and control system, allowing both function tests and DC tests to be performed simultaneously without requiring separate oscilloscopes or measurement equipment.
Solution Approach 2:
The test apparatus is designed with multi-functional capabilities where a single device can perform function tests, DC tests, and waveform measurements concurrently. The waveform measurement unit can measure power supply voltage and current across multiple channels simultaneously, while the DC test unit performs electrical characteristics measurement, and both can operate on the same DUT without requiring additional specialized hardware for each test type.
2Measurement precision
If additional hardware like oscilloscope is used for waveform measurement, then waveform data can be acquired, but data acquisition time is restricted and cannot cover long period function tests
Solution Approach 1:
The waveform measurement unit is designed to continuously acquire waveform data throughout the entire duration of function tests. The internal memory system continuously stores measured data from multiple channels, and the integrated architecture allows uninterrupted measurement from the start to the end of long-period function tests without time restrictions, enabling complete waveform analysis throughout the entire test cycle.
3Productivity
If conventional test apparatus is used, then simple test structure is maintained, but inability to perform parallel tests limits data collection efficiency
Solution Approach 1:
The test apparatus is divided into functionally independent units including a waveform measurement unit with multi-channel capture capability and a DC test unit, each capable of operating independently yet simultaneously. This segmented architecture allows parallel execution of different test types while maintaining clear functional boundaries, improving data collection efficiency without creating excessive system complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables continuous acquisition of large amounts of data from multiple channels with high efficiency, overcoming the limitations of conventional systems by allowing simultaneous function and DC testing without time constraints.
Implementation Method 1
an A/D converter structured to convert an electrical signal of the corresponding channel into a digital signal
Data Source
AI summary
A waveform data acquisition module acquires the waveforms of electrical signals for multiple channels. A memory controller continuously writes a digital signal S3 to one from among a first memory unit and a second memory unit. When a given memory unit has become full, the memory controller notifies an external higher-level controller that the corresponding memory unit is full and switches the wiring target to the other memory unit.