Waveform Display Device for Cycle Time Comparison
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Solution Overview
Problem
Current waveform display devices require cumbersome and time-consuming operations to align and compare multiple machining waveforms, especially when comparing cycle times, due to the need for frequent manual adjustment of time axes and data entry for each comparison area.
Innovation Solution
A waveform display device that automatically aligns multiple waveforms by generating correspondence data between points on different waveforms, allowing for seamless overlap and visualization of cycle time differences, reducing the effort required for comparisons and facilitating the identification of cycle time variations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual offsetting of time axes is performed to align waveforms for comparison, then waveform alignment is achieved, but the operation becomes cumbersome and time-consuming
Solution Approach 1:
The system automatically performs preliminary actions by calculating correspondence data between multiple waveforms in advance, determining the optimal offset amounts before the user initiates comparison. This eliminates the need for users to manually adjust time axes repeatedly, as the waveforms are pre-aligned based on calculated correspondence between characteristic points.
Solution Approach 2:
The waveform comparison system performs self-service by automatically calculating offset amounts and aligning waveforms without requiring manual user intervention. The system independently determines correspondence data between waveforms, computes the necessary time axis offsets, and displays aligned waveforms automatically, freeing users from repetitive manual adjustment tasks.
2Adaptability or versatility
If multiple waveforms are aligned for different process areas, then comprehensive comparison is enabled, but the complexity of repeated offsetting operations increases
Solution Approach 1:
The correspondence data calculation mechanism serves multiple functions: it aligns waveforms for different process areas, enables cycle time comparison, and supports various waveform types. By calculating correspondence data between characteristic points in a universal manner, the system handles diverse comparison scenarios with a single unified approach, eliminating the need for separate alignment procedures for each comparison area.
Solution Approach 2:
The system performs preliminary calculation of correspondence data for all waveforms across different process areas before comparison is needed. This pre-computation enables comprehensive waveform alignment for multiple processes without requiring repeated manual offsetting operations, reducing operational complexity while maintaining versatile comparison capabilities.
3Productivity
If cycle time differences are identified through waveform comparison, then machining optimization is enabled, but the examination process requires significant time and effort
Solution Approach 1:
The system performs self-service by automatically calculating correspondence data, determining offset amounts, and displaying aligned waveforms with cycle time differences. This automated process eliminates the need for operators to spend significant time manually aligning waveforms and measuring cycle times, enabling rapid identification of cycle time differences while maintaining the capability for machining optimization.
Data Source
AI summary
A waveform display device displays first and second waveform data whose value changes with respect to a time axis. Based on a first point on the first waveform data, a second point on the second waveform data which is in a correspondence with the first point is obtained. Correspondence data indicating a correspondence between the first point and the second point is generated. Then, based on the correspondence data, the first and second waveform data is displayed in a manner such that a predetermined point (a reference point) on the first waveform data and a point on the second waveform data which is in a correspondence with the reference point overlap one another on a time axis.