Waveform Generator Synchronizes Lamp and Square Waves
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Solution Overview
Problem
Conventional waveform generators struggle to produce high-speed lamp waves with low noise, leading to increased distortion and measurement variations due to insufficient bandwidth in test circuits, which hampers the efficiency of ADC testing.
Innovation Solution
A waveform generator and shaper that combines a lamp wave generating section with a square wave generating section and low-pass filters to synchronize and filter the waveforms, compensating for distortion by adding a square wave with adjusted amplitude based on the lamp wave's inclination and the low-pass filter's time constant, thereby reducing noise and maintaining waveform linearity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If a high-speed lamp wave is used to shorten testing time and enhance test throughput, then productivity is improved, but noise increases and measurement precision deteriorates due to insufficient bandwidth in test circuits
Solution Approach 1:
The waveform generation is segmented into two independent components: a lamp wave generating section that produces the linear ramp waveform, and a square wave generating section that produces the compensation signal. This segmentation allows each section to be optimized independently, enabling high-speed operation while maintaining signal integrity and low noise through separate generation and controlled combination of the waveforms.
Solution Approach 2:
The square wave compensation signal is generated in advance with amplitude determined by the lamp wave's inclination and the low-pass filter's time constant. This preliminary anti-action counteracts the distortion and noise that would otherwise be introduced by the low-pass filter, allowing the system to operate at high speeds without sacrificing measurement precision.
2Speed
If the bandwidth of the test circuit is broadened to accommodate high-speed lamp waves, then speed is improved, but noise increases and reliability deteriorates
Solution Approach 1:
A low-pass filter is introduced as an intermediary component between the waveform generation and the ADC testing. The filter's time constant is carefully selected to balance speed and noise reduction. The square wave compensation signal, generated with amplitude based on the lamp wave inclination and filter time constant, compensates for the filter's smoothing effect, maintaining waveform linearity while reducing high-frequency noise.
Solution Approach 2:
The system dynamically adjusts the square wave amplitude parameter based on the lamp wave inclination and low-pass filter time constant. This parameter change allows the compensation signal to adapt to different operating conditions, maintaining optimal noise reduction and waveform integrity across varying speeds while preserving measurement reliability.
3Device complexity
If a conventional lamp wave generator is used, then device complexity is low, but manufacturing precision deteriorates due to waveform distortion from insufficient bandwidth
Solution Approach 1:
The invention merges the lamp wave generating section and square wave generating section into a unified waveform generator system. The waveform adding section combines these two waveforms with properly synchronized timing, creating a composite signal that maintains linearity and precision. This merging approach achieves high manufacturing precision without requiring complex external bandwidth extension circuits.
Solution Approach 2:
The square wave compensation signal is generated in advance with its amplitude predetermined by the lamp wave inclination and low-pass filter time constant. This preliminary action ensures that the compensation is already built into the signal before it reaches the ADC, eliminating waveform distortion without requiring complex real-time adjustment mechanisms, thus maintaining device simplicity while improving manufacturing precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables the generation of high-speed lamp waves with reduced noise and distortion, enhancing test throughput and precision in ADC testing by compensating for frequency characteristics in the test circuit.
Implementation Method 1
a low-pass filter that removes a predetermined frequency band component from a waveform output from the waveform adding section
Data Source
AI summary
There is provided a waveform generator that generates a waveform. The waveform generator includes: a lamp waveform generating section that generates a lamp wave of which a signal value linearly changes for a predetermined period; a square wave generating section that generates a square wave of which pulse width is generally equivalent to the predetermined period; a waveform adding section that generally accords a timing at which a signal value in the lamp wave begins to be changed and a timing at a leading edge of the square wave, to add the lamp wave and the square wave; and a low-pass filter that removes a predetermined frequency band component from a waveform output from the waveform adding section.