Waveform Measurement Using Dynamic Clock Counting
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Solution Overview
Problem
Current waveform measurement technologies lose high-frequency information when measuring signals with long cycles, struggle to accurately identify waveforms with variable frequencies, and produce inaccurate results for signals with low duty cycles, lacking flexibility in data processing.
Innovation Solution
A waveform measuring method that converts the input signal into two square waves, uses a fixed high-frequency clock for accurate counting, filters out invalid waveforms, and stops acquisition when a set number of flips is reached, allowing for optimized data processing and calculation of waveform parameters by the host computer software.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple measurement gears and function modes are provided for waveform measurement, then users can select measurements according to frequency cycle and measurement items, but the measurement results become inaccurate and unreliable for signals with long cycles, variable frequencies, or very low duty cycles
Solution Approach 1:
The patent implements a universal measurement method that works across all signal types (long cycle, variable frequency, low duty cycle) without requiring mode selection. The hardware logic device automatically adapts to different waveform characteristics by counting clock cycles between waveform flips and determining measurement results based on the counted value, eliminating the need for multiple measurement gears and function modes while maintaining high accuracy across all signal types.
2Device complexity
If measurement gears are fixed (1K, 10K, 100K, 1M), then the device structure is simple, but high frequency information is lost when measuring signals with long cycles
Solution Approach 1:
The patent changes the measurement parameter from fixed gear-based scaling to dynamic clock cycle counting. The hardware logic device counts the number of clock cycles between waveform flips, where the clock frequency determines the measurement resolution. This allows the measurement system to automatically adapt to different signal frequencies without losing high-frequency information, as the counting mechanism can resolve individual clock cycles regardless of the overall signal period length.
3Ease of operation
If waveform measurement uses fixed measurement gears, then the device is easy to operate, but waveforms with variable frequency during the cycle cannot be accurately identified and measured
Solution Approach 1:
The measurement system performs self-service by automatically adapting to variable frequency waveforms without user intervention. The hardware logic device counts clock cycles between waveform flips and the processing device determines the measurement result based on the counted value, automatically adjusting to the actual signal characteristics. This eliminates the need for users to select measurement modes or gears, making the device easy to operate while maintaining high accuracy for variable frequency signals.
4Adaptability or versatility
If multiple measurement modes are provided, then the flexibility of data processing is insufficient for signals with very low duty cycle
Solution Approach 1:
The patent implements a dynamic measurement approach where the hardware logic device counts clock cycles between waveform flips and the processing device determines the measurement result based on the counted value. This dynamic counting method adapts to very low duty cycle signals by measuring the time between rare waveform events, providing both high reliability for low duty cycle measurements and flexible data processing capabilities without requiring special measurement modes.
Data Source
AI summary
The present invention discloses a waveform measuring method. It converts the waveform to be measured into two corresponding square waves by two comparators. When the hardware logic device receives the signal from the host computer software to start waveform acquisition, it acquires two square waves and simultaneously starts the counter to count with a fixed high frequency clock. When the waveform is flipped, if the count value is less than the set filter value, the waveform is filtered out; if the count value is greater than the set filter value, the hardware logic device saves the waveform and count value and clears the counter to zero. The number of waveform flips is judged whether the set value is reached, and if not, the count is recounted; if it is reached, the waveform acquisition is stopped, and then the waveform and count values saved by the hardware logic device are read and optimized by the host computer software. According to the test requirements, the corresponding algorithm is executed, and the calculation results are output. It improves the accuracy and precision of the measurement and increases the flexibility of the measuring method.