Waveform Processing Assistance for Robust Peak Separation

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Solution Overview

Problem

In waveform processing, determining appropriate parameters for peak separation is challenging due to variations in analysis device accuracy and separation column deterioration, leading to inconsistent peak detection and degraded quantitative analysis results.

Innovation Solution

A waveform processing assistance device and method that acquire and display correspondence relationships between waveform processing parameters and peak separation results, allowing for the determination of robust parameter values through a user interface, enabling easy identification of parameters that yield consistent and accurate peak separation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the user manually determines waveform processing parameter values, then the peak separation can be adjusted, but it is difficult to determine appropriate values and the process is time-consuming

Engineering Contradiction:
Improvepeak separation accuracyVSAvoidparameter determination time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system automatically performs preliminary waveform processing using multiple different parameter values before user selection, generating multiple peak separation results in advance. This allows the user to review and select from pre-computed options rather than manually determining parameters from scratch, significantly reducing the time required while maintaining accurate peak separation.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system creates multiple copies of the waveform processing results, each corresponding to a different parameter value. The user can review these copied results and select the most appropriate one, eliminating the need for repeated manual processing and parameter adjustment, thus saving time while ensuring accurate peak separation.

Inventive Principle:
Principle #26Copying

2Reliability

If a single waveform processing parameter value is used, then the processing is simple, but the results vary when the same sample is analyzed multiple times due to device accuracy and column deterioration

Engineering Contradiction:
Improvequantitative analysis consistencyVSAvoidparameter evaluation system
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The system evaluates multiple waveform processing parameter values simultaneously and displays their respective results. This allows the user to select a parameter value that provides consistent and reliable peak separation results across multiple analyses, even when device accuracy or column performance varies. The increased parameter evaluation capability ensures reliable quantitative analysis despite the more complex selection process.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS20220146471A1Waveform processing assistance device and waveform processing assistance method
Publication Date: 2022.05.12 SHIMADZU CORP
  • US20220146471A1 patent drawing
  • US20220146471A1 patent drawing
  • US20220146471A1 patent drawing

AI summary

A waveform processing assistance device includes an acquirer that acquires a correspondence relationship between a plurality of values of a waveform processing parameter and a plurality of results of waveform processing as a plurality of peak separation information pieces in regard to a plurality of peaks that are separated from one or a plurality of waveform data pieces based on the plurality of values of the waveform processing parameter, a determiner that determines robustness of each value of the waveform processing parameter based on a plurality of peak separation information pieces acquired by the acquirer, and a display controller that causes the display to display a plurality of peak separation information pieces acquired by the acquirer and a robustness information piece representing robustness of each value of the waveform processing parameter that is calculated by the determiner.