Wavefront Detector Heterodyne Feedback Loop

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Solution Overview

Problem

Existing wavefront detection techniques suffer from limited spatial resolution and small frequency operating bandwidth, making them inadequate for measuring dynamic phase disturbances in wavefronts, such as those experienced by signal beams from distant sources like satellites passing through the atmosphere.

Innovation Solution

A wavefront detector that combines a signal beam with a locally generated reference beam, using a feedback loop to control the reference beam's frequency, phase, and polarization to match the signal beam, allowing for accurate measurement and compensation of wavefront distortions through phase-stepping interferometry and adaptive interference pattern analysis.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If known wavefront detection techniques are used, then device simplicity is maintained, but spatial resolution is too limited and frequency operating bandwidth is too small

Engineering Contradiction:
Improvespatial resolutionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The wavefront detector divides the incoming wavefront into multiple sub-apertures using a lens array, with each sub-aperture processed independently by corresponding photodetectors. This segmentation enables high spatial resolution by measuring phase information across multiple discrete regions simultaneously, overcoming the limitation of conventional techniques that use a single integrated detector.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces temporal dimension through heterodyne detection, where a reference beam with a frequency offset is combined with the signal beam. This creates a time-varying interference pattern at the beat frequency, allowing phase information to be extracted in the time domain while maintaining spatial information across multiple detectors, thus achieving high spatial resolution without proportionally increasing device complexity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If known wavefront detection techniques are used, then device complexity is kept low, but frequency operating bandwidth is too small to measure dynamic phase disturbances

Engineering Contradiction:
Improvefrequency operating bandwidthVSAvoiddevice complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The system employs dynamic heterodyne detection where the reference beam frequency is intentionally offset from the signal beam frequency by a controllable amount. This creates a time-varying interference signal that can be processed by photodetectors to extract phase information at the beat frequency, enabling the system to track dynamic wavefront changes with high frequency bandwidth while maintaining a relatively simple optical configuration.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent implements feedback control where the measured interference signals from multiple photodetectors are processed to determine wavefront phase information, which can then be used to adjust the reference beam frequency offset or other system parameters. This feedback mechanism enables the system to adapt to changing conditions and maintain high frequency operating bandwidth for measuring dynamic disturbances.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If an internal reference light source is used, then measurement capability is improved, but variable differences in phase, frequency, and polarization between signal and reference beams affect interference pattern measurement

Engineering Contradiction:
Improvewavefront measurement accuracyVSAvoidinterference pattern measurement difficulty
Core Design Contradiction:
Measurement precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The system deliberately changes the frequency parameter of the reference beam by introducing a controlled frequency offset relative to the signal beam. This frequency shift transforms the interference pattern into a time-varying signal at the beat frequency, making it easier to distinguish from static intensity variations and to extract phase information through temporal analysis, thereby improving measurement accuracy despite using an independent reference source.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent replaces direct spatial interference measurement with temporal interference measurement through heterodyne detection. Instead of relying on static interference patterns that are sensitive to alignment and polarization differences, the system uses time-varying interference signals that can be processed electronically, reducing the difficulty of measurement while maintaining high precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables precise determination and compensation of wavefront distortions, improving spatial resolution and frequency bandwidth, thereby effectively measuring and correcting wavefront deformations in signal beams, such as those from satellites.

Implementation Method 1

a beam combiner configured to receive the signal beam and combine the signal beam with a reference beam generated by a reference light source

Methodology Applied
Scientific EffectInterference: Interference

Implementation Method 2

an image detector with an array of photosensitive pixels configured to receive and measure an interference pattern of the combined signal and reference beams

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 3

a feedback controller is configured to receive an interference signal based on measurement of at least part of the combined signal and reference beams, and control generation of the reference beam by a feedback loop based on the interference signal

Methodology Applied
Scientific EffectFeedback control: Feedback

Data Source

PatentEP3714244B1Wavefront detector
Publication Date: 2023.06.07 NEDERLANDSE ORG VOOR TOEGEPAST NATUURWETENSCHAPPELIJK ONDERZOEK TNO
  • EP3714244B1 patent drawingFigure 1
  • EP3714244B1 patent drawingFigure 2
  • EP3714244B1 patent drawingFigure 3

AI summary

A wavefront detector (100) and method for determining a signal wavefront (Ws) of a signal beam (Ls). A beam combiner (11) is configured to combine the signal beam (Ls) with a reference beam (Lr). An image detector (12) comprising an array of photosensitive pixels (12p) is configured to receive and measure an interference pattern (Wrs) of the combined signal and reference beams (Lr+Ls). A reference light source (14) is configured to generate the reference beam (Lr). A feedback controller (20) is configured to receive an interference signal (IB) based on measurement of at least part of the combined signal and reference beams (Lr+Ls), and control generation of the reference beam (Lr) by a feedback loop based on the interference signal (IB).