Wavefront Testing System Using Multi-Exposure Lens Array
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Solution Overview
Problem
Conventional wavefront testing systems require costly and imperfect null correctors and collimators, leading to inaccurate wavefront measurements due to non-uniform light spot distributions caused by optical aberrations, making it difficult to achieve precise wavefront information without these components.
Innovation Solution
A wavefront testing system that uses a light source and image capturing unit with a lens array and sensor module, controlled by a processing unit to generate and capture images under varying exposure conditions, allowing for the detection of non-uniform light rays and calculation of wavefront information without a null corrector or collimator, optimizing exposure settings to capture light spots within a predetermined range and improve sampling density.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a null corrector and collimator are used to compensate optical aberration, then wavefront measurement accuracy is improved, but system cost and device complexity increase
Solution Approach 1:
The patent removes the null corrector and collimator from the optical testing system, extracting these components that caused complexity and cost issues. The system achieves wavefront measurement by directly capturing light spots from the lens array without requiring these additional compensating components, thereby reducing device complexity while maintaining measurement capability through alternative computational methods.
Solution Approach 2:
The patent replaces expensive, precision-manufactured null correctors and collimators with a simpler, more economical lens array system. The lens array consists of standard lenses that can be manufactured at lower cost and with less precision requirement, achieving the same functional goal of wavefront analysis through digital processing rather than optical compensation.
2Measurement precision
If a null corrector is used to compensate spherical aberration, then wavefront measurement accuracy is improved, but manufacturing cost increases
Solution Approach 1:
The patent replaces expensive null correctors with inexpensive lens array elements. Each lens in the array is a simple optical element that can be manufactured at low cost using standard processes, eliminating the need for costly custom-manufactured null correctors while achieving equivalent or better measurement results through computational wavefront reconstruction.
Solution Approach 2:
The patent replaces the mechanical/optical compensation system (null corrector with precision mechanics) with a static lens array combined with digital image processing. The wavefront compensation function is achieved through computational algorithms rather than mechanical adjustment and optical compensation, significantly reducing manufacturing cost.
3Measurement precision
If exposure time is increased to capture dim light spots, then measurement coverage is improved, but saturation of bright spots occurs
Solution Approach 1:
The patent uses multiple images taken at different exposure times to capture the complete dynamic range of light spot intensities. By acquiring a series of images with varying exposure durations, the system ensures that both dim and bright spots are properly captured without saturation, combining the information from all images to achieve comprehensive wavefront measurement.
Solution Approach 2:
The patent employs multiple exposure settings where some images use shorter exposure times to capture bright spots without saturation, while other images use longer exposure times to capture dim spots. This partial action approach ensures that each exposure setting captures only the appropriate intensity range, and the combined data provides complete coverage.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces system costs, enhances measurement accuracy by achieving uniform wavefront sampling density, and improves the sensitivity of wavefront testing, particularly in regions with high optical aberration, allowing for precise wavefront information retrieval.
Implementation Method 1
light generated by a point source of light located in an object space propagates through the optical element in the form of spherical waves
Implementation Method 2
light passing through each of the lenses 151 of the micro-lens array 15 converges into a plurality of light spots
Implementation Method 3
The image sensor 16 detects the light projected thereon from the micro-lens array 15, forming at least one image within the range of the light beams
Data Source
AI summary
An optical wavefront testing system includes a light source, an image capturing unit and a processing unit. The image capturing unit includes a lens array and a sensor module that is configured to detect light rays passing through an optical element and the lens array. The processing unit controls the sensor module to detect the light rays under a plurality exposure conditions for generating a plurality of images each including a plurality of light spots, obtains a plurality of light spot datasets corresponding to the light spots and each including a plurality of pixel coordinate sets and a plurality of pixel values, and obtains wavefront information associated with the light spots based on the light spot datasets of at least two of the images.