Waveguide Image Anomaly Detection for Automated Defect Screening

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Solution Overview

Problem

Human error and bottlenecks in waveguide evaluation processes during manufacturing due to the reliance on human intervention for defect detection in waveguides, leading to inefficiencies and potential defects in radio-frequency (RF) waveguides.

Innovation Solution

A computer-implemented method and system that uses image data from waveguides to compute statistical values, generate an extremity matrix based on an anomaly detector model, and determine whether a waveguide is conforming or non-conforming using pre-computed probability distributions and thresholds, reducing the need for human intervention.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If human intervention is used for waveguide defect detection, then measurement precision can be maintained through expert judgment, but productivity decreases due to manual evaluation bottlenecks

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidproduction throughput
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent replaces the mechanical human evaluation process with an automated computational system that uses image processing and statistical analysis. The system captures images of waveguides, computes statistical values of pixels at various image locations, generates extremity matrices, and automatically determines conformance without human intervention, thereby maintaining detection precision while dramatically improving productivity.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system enables waveguide defect detection to be self-performing through automated image analysis. The computational method independently processes waveguide images, computes statistical metrics, generates extremity matrices, and makes conformance determinations without requiring external human evaluation, thus eliminating bottlenecks while preserving accuracy.

Inventive Principle:
Principle #25Self-service

2Reliability

If human evaluation is used for waveguide inspection, then complex defect patterns can be identified through experience, but human error increases and consistency decreases

Engineering Contradiction:
Improveevaluation consistencyVSAvoidsystem automation complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent transforms the qualitative human evaluation process into quantitative parameter-based analysis. By computing statistical values of pixels, generating extremity matrices with specific threshold comparisons, and using standardized computational algorithms, the system achieves consistent, repeatable results that eliminate human error and variability while maintaining reliable defect detection.

Inventive Principle:
Principle #35Parameter changes

3Productivity

If automated image processing is implemented, then productivity increases and human error decreases, but measurement precision may deteriorate without expert judgment

Engineering Contradiction:
Improveevaluation throughputVSAvoiddefect detection accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent segments the waveguide image into multiple image locations and computes statistical values for pixels at each location independently. This segmentation allows the automated system to analyze complex defect patterns through systematic breakdown of the image into manageable regions, maintaining detection precision while enabling high-speed automated processing.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces additional analytical dimensions by computing statistical values across multiple image locations and generating extremity matrices that add layers of computational analysis. This multi-dimensional approach allows the automated system to capture complex defect characteristics that would require expert human judgment, thereby maintaining precision while achieving high productivity.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS20240125708A1Systems and methods for identifying waveguide defects
Publication Date: 2024.04.18 VIASAT INC
  • US20240125708A1 patent drawing
  • US20240125708A1 patent drawing
  • US20240125708A1 patent drawing

AI summary

Systems and methods are described herein for waveguide defect detection. In some examples, a statistical value of pixels of a number of image locations in one or more images of the waveguide can be computed. An extremity matrix can be generated based on an anomaly detector model and statistical pixel data that includes statistical values computed for respective image locations in the one or more images of the waveguide. A decision can be made to determine whether the waveguide is a conforming or a non-conforming waveguide based on the extremity matrix and a set of thresholds. In some examples, the statistical value is a mean intensity value or an average intensity value.