Optical Waveguide Insulating Film Refractive Index Gradient

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Solution Overview

Problem

Semiconductor devices with optical waveguides face reliability issues due to leaked light causing noise from metal wiring and heater metal wires, which affects signal integrity and chip area efficiency.

Innovation Solution

The solution involves forming an optical waveguide with a refractive index n1 and a second insulating film with refractive index n2 over a first insulating film, with a third insulating film having a refractive index n3, where n1 > n2 and n3 > n2, and the shortest distance between the waveguide and the third insulating film is smaller than the first insulating film's thickness, using silicon nitride or silicon oxynitride to suppress return light and improve signal reliability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If metal wiring and heater metal wires are placed close to the optical waveguide to reduce chip area, then chip size is reduced, but noise from return light increases and signal reliability deteriorates

Engineering Contradiction:
Improvechip areaVSAvoidsignal reliability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

A third insulating film with refractive index n3 (where n3 > n2) is introduced between the second insulating film and the metal wiring/heater metal wire. This intermediary layer suppresses the generation of return light by creating a refractive index gradient that prevents light reflection back into the optical waveguide, thereby reducing noise while allowing close placement of wiring for compact chip design

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The refractive index parameter is strategically manipulated by selecting materials for the third insulating film with n3 > n2 (higher than the second insulating film). This parameter change creates an optimal refractive index profile (n1 > n2 and n3 > n2) that suppresses return light generation, enabling close wiring placement without compromising signal reliability

Inventive Principle:
Principle #35Parameter changes

2Reliability

If metal wiring is placed farther from the optical waveguide to reduce noise, then signal reliability is improved, but chip area increases and wiring efficiency decreases

Engineering Contradiction:
Improvesignal reliabilityVSAvoidchip area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The third insulating film acts as a mediator that enables close wiring placement by suppressing return light generation through its specific refractive index property (n3 > n2). This eliminates the need for large spacing between wiring and optical waveguide, maintaining compact chip area while ensuring signal reliability

Inventive Principle:
Principle #24Intermediary (Mediator)

3Area of stationary object

If the shortest distance between the optical waveguide and the third insulating film is made smaller than the first insulating film thickness to improve wiring efficiency, then chip area is reduced, but manufacturing precision requirements increase

Engineering Contradiction:
Improvechip areaVSAvoidfilm thickness control
Core Design Contradiction:
Area of stationary objectVSManufacturing precision

Solution Approach 1:

By changing the refractive index parameter of the third insulating film to be higher than the second insulating film (n3 > n2), the design achieves return light suppression with a compact structure where the shortest distance from the optical waveguide to the third insulating film can be smaller than the first insulating film thickness, optimizing chip area while maintaining manufacturability

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration effectively reduces noise from return light, enhances signal reliability, and allows for more efficient wiring arrangements, reducing chip size and parasitic resistance while maintaining control over the refractive index of the optical waveguide.

Implementation Method 1

the refractive indices n1, n2, and n3 satisfy the relationship of n1>n2 and n3>n2

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentUS11079540B2Semiconductor device
Publication Date: 2021.08.03 RENESAS ELECTRONICS CORP
  • US11079540B2 patent drawing
  • US11079540B2 patent drawing
  • US11079540B2 patent drawing

AI summary

Two optical waveguides and an insulating film provided to cover the optical waveguides are formed over an insulating layer. Two wirings and a heater metal wire are formed over the insulating film via an insulating film different from the above insulating film. The latter insulating film is thinner than the former insulating film, and has a higher refractive index than the former insulating film. The leaked light from either of the two optical waveguides can be suppressed or prevented from being reflected by any one of the two wirings, the heater metal wire, and the like to travel again toward the two optical waveguides by utilizing the difference between the refractive indices of the two insulating films.