Waveguide Test Socket for High-Frequency Microcircuit Contact
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Solution Overview
Problem
Microcircuit test equipment faces challenges in making accurate, low-resistance, non-destructive electrical contact with closely spaced contacts, leading to incorrect identifications of defective or functional devices, especially at high frequencies, and existing systems struggle with signal losses and interference.
Innovation Solution
A test socket with a housing and elastomeric biasing compliance member that adapts to varying heights of high-frequency ports, providing resilient and shielding contact points, and a waveguide interface that converts lower to higher frequency band structures for improved signal transmission and compliance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional test equipment makes electrical contact with microcircuit contacts, then testing can be performed, but contact accuracy and reliability deteriorate due to small contact size and spacing
Solution Approach 1:
The patent introduces a test socket as an intermediary device between the test equipment and the microcircuit. The socket provides pre-positioned contact points that precisely match the microcircuit contact locations, eliminating the need for complex positioning mechanisms in the test equipment itself. This mediator handles the precision requirement, allowing the main test equipment to remain simpler.
Solution Approach 2:
The test socket is prepared in advance with contact points precisely positioned and configured before the actual testing occurs. The socket undergoes preliminary alignment and positioning, so that when the microcircuit is inserted, accurate electrical contact is immediately established without requiring complex real-time adjustment mechanisms.
2Reliability
If test equipment makes contact with microcircuit contacts, then electrical testing is enabled, but connection reliability worsens due to misalignment and incorrect connections
Solution Approach 1:
The test socket serves as a mediator that absorbs the alignment tolerance issues. It provides a stable, pre-aligned interface that ensures reliable electrical contact between the test equipment and the microcircuit, preventing misalignment errors from affecting measurement precision.
Solution Approach 2:
The socket design incorporates tolerance compensation features that cushion against potential misalignment issues before they affect the actual measurement. The contact points are designed with appropriate tolerances and positioning features that prevent incorrect connections even when minor variations occur during insertion.
3Speed
If high frequency signals are transmitted through conventional test systems, then signal transmission is achieved, but signal losses and interference increase
Solution Approach 1:
The test socket acts as an intermediary transmission path optimized for high frequency signals. It provides a controlled impedance pathway with proper shielding and grounding, enabling fast signal transmission while minimizing losses and interference that would occur through conventional test system connections.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and reliable testing of microcircuits at high frequencies with reduced signal losses and interference, preventing damage to circuit boards and improving manufacturing efficiency by ensuring correct identification of defective devices.
Implementation Method 1
a HF shielding elastomeric biasing compliance member positioned to bias said insert portion resiliently into said port on the DUT
Implementation Method 2
a HF shielding elastomeric biasing compliance member positioned to bias said insert portion resiliently into said port on the DUT
Data Source
AI summary
A structure and method for providing a housing which includes a high frequency (HF) connection between a device under test (DUT) having a wave port 20 and a load board via a waveguide structure. The waveguide includes a wave insert 42, a waveguide adapter 24 and a conductive compliant member 40 which maintains bias between the adapter 24 and the DUT HF port 20 while also maintaining an RF shield despite the variable height of the DUT wave port. The adapter may also include a projection 64 which is received in a recess in the waveguide so that the shielding between the waveguide and adapter has full integrity.