Wavelength Checker Using Infrared-to-Visible Conversion
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Solution Overview
Problem
Conventional optical spectrum analyzers are large, heavy, and require a power source, making them difficult to use for checking signal light presence or isolating failures in Passive Optical Network (PON) systems during inspections.
Innovation Solution
A wavelength checker with an optical waveguide chip and a light conversion portion using a conversion material that converts near-infrared light to visible light, mounted on a main substrate with a reflection portion inclined to direct visible light emission upwards, allowing easy detection of signal light presence or absence.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If an optical spectrum analyzer is used to measure wavelength, then measurement precision is improved, but device complexity and portability deteriorate due to large size and heavy weight
Solution Approach 1:
The patent extracts the essential wavelength measurement function from the complex optical spectrum analyzer by using a simplified structure: an optical waveguide chip with arrayed waveguide diffraction grating separates wavelengths, and a light conversion portion converts infrared light to visible light for direct visual detection. This eliminates the need for complex movable diffraction gratings and detectors while maintaining wavelength measurement capability.
Solution Approach 2:
The patent creates a visual copy of the invisible infrared signal by converting it to visible light through the light conversion portion. This allows operators to directly see the wavelength information without complex electronic detection systems, achieving measurement functionality with a simple visual interface.
2Measurement precision
If an optical spectrum analyzer is used, then wavelength measurement capability is improved, but ease of operation deteriorates due to power source requirements
Solution Approach 1:
The patent makes the measurement system self-powered by using the optical signal itself as the energy source. The arrayed waveguide diffraction grating passively separates wavelengths through optical physics, and the light conversion portion converts infrared photons to visible photons without requiring external power. This eliminates all power source requirements while maintaining wavelength detection capability.
3Measurement precision
If conventional wavelength measurement methods are used, then measurement capability is improved, but productivity deteriorates due to difficulty in carrying out inspections
Solution Approach 1:
The patent replaces the mechanical and electronic system of optical spectrum analyzers with a passive optical system based on waveguide diffraction and photonic conversion. This eliminates mechanical moving parts and electronic power requirements, creating a tool that can be easily transported and deployed for rapid field inspections, thereby improving productivity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and portable checking of signal light presence or failure isolation in PON systems without the need for a power source, improving inspection efficiency.
Implementation Method 1
an arrayed waveguide diffraction grating
Implementation Method 2
a light conversion portion constituted by a conversion material that converts near infrared light to visible light
Implementation Method 3
the reflection portion includes a reflection surface that faces the light emission end surface and is inclined with respect to a plane of the main substrate such that a reflection direction is toward the upper side of the main substrate
Data Source
AI summary
A light conversion portion includes a conversion material that converts infrared light to visible light. A reflection portion is fixed to a position on a main substrate at which the reflection portion faces an output end of an optical waveguide chip on the side from which light is output to an external space. The reflection portion includes a reflection surface that faces the output end and is inclined with respect to a plane of the main substrate such that a reflection direction is toward the upper side of the main substrate. The reflection surface reflects near infrared light.