Wavelength-Encoded Light Inspection for Container Defects
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Solution Overview
Problem
Existing methods for optically inspecting containers require multiple inspection units with different emission characteristics, leading to increased costs and installation space.
Innovation Solution
A method and device that utilize a single inspection unit with a light-emitting surface that emits light locally encoded by wavelength property, allowing the camera to distinguish between defects and foreign objects based on changes in light refraction and absorption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple inspection units with different emission characteristics are used to detect both foreign objects and defects, then detection capability is improved, but installation space and costs increase
Solution Approach 1:
The patent applies a single inspection unit that performs multiple functions by using a light-emitting surface that emits light with spatially varying wavelength properties. This single unit can detect both foreign objects and defects by analyzing different aspects of light interaction (absorption for foreign objects, refraction for defects), eliminating the need for separate inspection units with different emission characteristics.
Solution Approach 2:
The patent changes the wavelength parameter of the emitted light across different spatial locations on the light-emitting surface. By encoding position information into wavelength variations, the system can distinguish between light reflected from foreign objects versus light refracted by defects, enabling dual detection functionality within a single inspection unit.
2Reliability
If multiple inspection units with different emission characteristics are used to detect both foreign objects and defects, then detection capability is improved, but costs increase
Solution Approach 1:
The patent applies a single inspection unit that performs multiple functions by using a light-emitting surface that emits light with spatially varying wavelength properties. This single unit can detect both foreign objects and defects by analyzing different aspects of light interaction (absorption for foreign objects, refraction for defects), eliminating the need for separate inspection units with different emission characteristics.
Solution Approach 2:
The patent merges the functionality of multiple inspection units into a single integrated system. By combining the light source with spatially varying wavelength properties and an image sensor capable of wavelength discrimination, the system consolidates what would traditionally require separate devices into one cost-effective unit.
3Area of stationary object
If a single inspection unit is used to detect both foreign objects and defects, then installation space is reduced, but detection accuracy may deteriorate
Solution Approach 1:
The patent changes the wavelength parameter of the emitted light across different spatial locations on the light-emitting surface. By encoding position information into wavelength variations, the system can distinguish between light reflected from foreign objects versus light refracted by defects, enabling dual detection functionality within a single inspection unit.
Solution Approach 2:
The patent uses the wavelength property of light as an intermediary carrier to encode spatial and identification information. The light-emitting surface acts as an intermediary that imprints wavelength-coded position information onto the light, which then interacts with the container and returns to the sensor, enabling the system to differentiate between foreign objects and defects through wavelength analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables the detection of both foreign objects and defects with a single inspection unit, reducing the need for multiple units and minimizing installation space, while maintaining high detection accuracy.
Implementation Method 1
the illumination unit emits light from a planar light-emitting surface
Implementation Method 2
the light is refrafted differently at the defects than at intact areas of the container due to the associated local change in the container surface. As a result, the light is deflected via the defect from a different emission location of the light-emitting surface towards the camera
Implementation Method 3
foreign objects, since, for example, soiling leads to local absorption of the light without then significantly influencing the light path to the camera
Data Source
AI summary
Method for optically inspecting containers, where the containers are transported to an inspection unit with an illumination unit and with a camera, where light emitted from a planar light-emitting surface of the illumination unit is transmitted or reflected via said containers, where the camera records in at least one camera image at least one of the respective containers and the light transmitted or reflected via them, where the light emitted from the light-emitting surface is locally encoded on the basis of a wavelength property and is recorded by the camera in such a way that different emission locations of the light-emitting surface can be distinguished from one another in the at least one camera image, and that the image processing unit evaluates the at least one camera image for location information of the emission locations, in order to distinguish the defects from the foreign objects.