Wavelength-Specific Sensitivity Control for Vegetation Inspection Accuracy

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Solution Overview

Problem

Conventional inspection apparatuses lack the accuracy in inspecting vegetation by inadequately controlling the sensitivity of different wavelength region components of ambient light reflected from inspection targets.

Innovation Solution

An inspection apparatus comprising a detection section that detects multiple wavelength region components of ambient light and a control section that adjusts the sensitivity of each component, allowing for precise inspection by calibrating the detection levels of specific wavelengths to avoid overexposure and underexposure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional inspection apparatus detects ambient light reflected from inspection target, then inspection can be performed, but inspection accuracy is insufficient due to inadequate sensitivity control of different wavelength region components

Engineering Contradiction:
Improveinspection accuracyVSAvoidsensitivity control complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent segments the detection process by wavelength region components, dividing the broadband ambient light detection into multiple discrete wavelength bands. Each wavelength region component is detected independently with dedicated sensitivity control, enabling precise measurement of spectral characteristics while maintaining manageable system complexity through modular detection channels.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by assigning different sensitivity characteristics to different wavelength region components based on their specific requirements. The control section adjusts sensitivity locally for each wavelength band according to the reflectance properties of the inspection target at that specific wavelength, rather than using uniform sensitivity across all wavelengths.

Inventive Principle:
Principle #3Local quality

2Measurement precision

If sensitivity of detection section is increased to detect low-intensity wavelength components, then detection capability improves, but overexposure occurs in high-intensity wavelength regions

Engineering Contradiction:
Improvedetection capabilityVSAvoidoverexposure
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The control section implements local quality by applying wavelength-specific sensitivity control to each detection element or wavelength region. This allows high sensitivity to be applied locally to wavelength components with low reflected intensity while maintaining lower sensitivity for wavelength regions with high reflected intensity, preventing overexposure in specific wavelength bands while preserving detection capability in others.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent changes the sensitivity parameter of the detection section dynamically based on the wavelength region being detected. The control section adjusts sensitivity parameters for different wavelength components according to their respective intensity levels, transforming a fixed sensitivity system into an adaptive one that optimizes detection range for each spectral component.

Inventive Principle:
Principle #35Parameter changes

3Object-affected harmful factors

If sensitivity of detection section is decreased to prevent overexposure in high-intensity wavelength regions, then overexposure is avoided, but underexposure occurs in low-intensity wavelength regions

Engineering Contradiction:
Improveoverexposure preventionVSAvoiddetection capability
Core Design Contradiction:
Object-affected harmful factorsVSMeasurement precision

Solution Approach 1:

The detection system is segmented into multiple wavelength region components, each with independent sensitivity control. This segmentation allows the system to prevent overexposure in high-intensity wavelength regions by applying reduced sensitivity to those specific bands while simultaneously applying enhanced sensitivity to low-intensity wavelength regions to prevent underexposure, with each segment optimized independently.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The control section implements local quality by applying differentiated sensitivity characteristics to different wavelength regions. High-intensity wavelength regions receive reduced sensitivity to prevent overexposure, while low-intensity wavelength regions receive enhanced sensitivity to prevent underexposure, with each wavelength band receiving locally optimized sensitivity settings based on its specific intensity characteristics.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables higher accuracy in vegetation inspection by ensuring that the detection levels of key wavelengths are within a dynamic range, effectively generating a more accurate normalized difference vegetation index (NDVI) and improving the overall inspection precision.

Implementation Method 1

a sensing element configured to detect, from each of planarly arrayed pixels, a plurality of different wavelength region components of ambient light that is reflected from an inspection target

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Data Source

PatentUS11448586B2Inspection apparatus, sensing apparatus, sensitivity control apparatus, inspection method, and program with pixel sensitivity control
Publication Date: 2022.09.20 SONY GROUP CORP
  • US11448586B2 patent drawing
  • US11448586B2 patent drawing
  • US11448586B2 patent drawing

AI summary

The present disclosure relates to an inspection apparatus, a sensing apparatus, a sensitivity control apparatus, an inspection method, and a program that perform inspection with improved accuracy. The inspection apparatus includes a detection section for detecting a plurality of different wavelength region components of ambient light reflected from an inspection target to be inspected, and a control section for controlling the sensitivity of each of the different wavelength region components. The control section controls the sensitivity by calculating a histogram indicating the detection level in every wavelength region of light reflected from the inspection target that is detected by the detection section, and determining, based on histograms of particular spectroscopic components, whether or not the sensitivity is properly set for the detection section. The present technology is applicable, for example, to an inspection apparatus that inspects vegetation.