Wavelength Shift Correction Using Spectrometer Intensity Ratios
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Solution Overview
Problem
Existing wavelength shift correction systems are limited by the need for light sources with wide emission line intervals, making it difficult to use light sources with narrow emission line intervals, which increases costs due to the requirement for bandpass filters.
Innovation Solution
A wavelength shift correction system that uses a spectrometer with a wavelength shift correction light source emitting multiple rays of wavelength shift correction emission-line light, where at least one photoelectric conversion element receives multiple rays of emission-line light, allowing for wavelength variation determination and correction regardless of emission line intervals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a light source with narrow emission line intervals is used as the wavelength shift correction light source, then the cost increases due to the requirement for bandpass filters, but the wavelength shift correction can still be performed
Solution Approach 1:
The invention extracts only the necessary information (wavelength shift amount) from the emission line light without requiring bandpass filters. By using the ratio of light intensities detected by adjacent photoelectric conversion elements, the system obtains wavelength correction data directly from the spectral data, eliminating the need for additional filtering components and reducing cost.
Solution Approach 2:
The invention introduces an intermediary calculation method (ratio of light intensities from adjacent photoelectric conversion elements) to determine wavelength shift. This intermediary approach allows the system to extract wavelength information from narrow emission line intervals without requiring physical separation filters, thereby reducing cost while maintaining measurement precision.
2Measurement precision
If bandpass filters are prepared to extract rays of emission-line light from a plurality of rays of emission line light having narrow emission line intervals, then the wavelength shift correction can be performed, but the cost increases
Solution Approach 1:
The invention extracts wavelength shift information through computational methods rather than physical filtering. By calculating the ratio of light intensities detected by adjacent photoelectric conversion elements, the system extracts the necessary wavelength correction data directly from the spectral signal without requiring bandpass filters, thereby simplifying device structure.
Solution Approach 2:
The invention replaces the mechanical/optical filtering system (bandpass filters) with a computational processing system. The wavelength shift correction is achieved through mathematical operations on the detected spectral data (intensity ratios), substituting physical filtering components with digital signal processing to reduce device complexity.
3Measurement precision
If a spectral luminance meter with aligned photoelectric conversion elements is used to measure emission line output, then wavelength shift correction is needed, but the emission line intervals must be independent in wavelength
Solution Approach 1:
The invention makes the wavelength shift correction system universal by enabling it to work with various light sources regardless of emission line interval characteristics. The method of using intensity ratios from adjacent photoelectric conversion elements applies to both narrow and wide emission line intervals, expanding the range of suitable light sources and improving system adaptability.
Solution Approach 2:
The invention changes the measurement parameter from requiring independent wavelength intervals to using intensity ratios that are valid regardless of interval size. By shifting from a parameter-dependent approach (independent intervals) to a parameter-independent approach (intensity ratios), the system gains versatility in light source selection while maintaining measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system effectively performs wavelength shift correction without being affected by emission line intervals, reducing costs by using a neon lamp as the wavelength shift correction light source and enabling accurate wavelength determination with a wavelength calculation table.
Implementation Method 1
a light separating unit that separates wavelength components of light in an incident optical signal into a plurality of spectral components in accordance with the wavelength
Implementation Method 2
a light receiving unit formed with aligned photoelectric conversion elements that receive light dispersed in accordance with the wavelength of incident light and output electrical signals corresponding to the light intensities of the respective received wavelength components
Data Source
AI summary
A wavelength shift correction system and method includes a wavelength shift correction light source that emits wavelength shift correction light including a plurality of rays of wavelength shift correction emission-line light; and a spectrometer including a spectroscopic unit that receives the respective rays of dispersed spectral light obtained by dispersing incident light in accordance with wavelength with a plurality of photoelectric converters in the dispersion direction, and outputs electrical signals corresponding to the light intensities of the rays of dispersed spectral light. When the wavelength shift correction light is measured as the incident light with the spectrometer to be subjected to wavelength shift correction, a wavelength variation is determined on the basis of the respective electrical signals output from a plurality of specific photoelectric conversion elements that receive the plurality of rays of wavelength shift correction emission-line light in the plurality of photoelectric conversion elements.