Composite Waveplate Optical Axis Alignment via Mueller Matrix Ellipsometry

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Solution Overview

Problem

Existing methods for aligning the optical axes of composite waveplates lack accuracy, particularly in achieving high measurement precision due to reliance on manual techniques or methods sensitive to single wavelengths, leading to complex operations and limited alignment accuracy.

Innovation Solution

An alignment method that involves fixing one waveplate and rotating another, detecting and analyzing spectral parameters such as equivalent rotary angle, axis azimuth, and retardance spectra using a dual rotating-compensator Mueller matrix ellipsometer, adjusting the rotation angle to minimize differences between measured and ideal spectral parameters.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If manual alignment method is used, then operation is simple, but alignment accuracy cannot be guaranteed

Engineering Contradiction:
Improveoperation simplicityVSAvoidalignment accuracy
Core Design Contradiction:
Ease of operationVSManufacturing precision

Solution Approach 1:

The patent replaces manual mechanical alignment operations with an automated optical detection and control system. The Mueller matrix ellipsometer automatically detects spectral parameters, and the computer controls the rotating table to adjust waveplate angles, eliminating manual intervention while achieving high alignment accuracy through automated feedback control.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent implements a feedback control system where the Mueller matrix ellipsometer continuously monitors spectral parameters (equivalent rotary angle, axis azimuth, and retardance spectra), compares them with target values, and automatically adjusts the waveplate orientations based on the detected deviations, ensuring high alignment accuracy through real-time feedback.

Inventive Principle:
Principle #23Feedback

2Manufacturing precision

If light extinction method is used, then alignment can be conducted, but it is sensitive to single wavelength and requires complex operations with multiple laser sources

Engineering Contradiction:
Improvealignment capabilityVSAvoidoperation complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent employs a Mueller matrix ellipsometer that can detect spectral parameters across multiple wavelengths simultaneously, making the alignment system universal and not limited to single-wavelength optimization. This multi-functional device eliminates the need for multiple laser sources while achieving accurate alignment at various wavelengths.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent changes the detection parameter from simple light extinction at a single wavelength to comprehensive spectral parameter detection (equivalent rotary angle, axis azimuth, and retardance spectra) across multiple wavelengths, enabling accurate alignment without requiring multiple laser sources or complex wavelength switching operations.

Inventive Principle:
Principle #35Parameter changes

3Manufacturing precision

If spectral parameters are detected and fluctuation is controlled, then high accuracy alignment is achieved, but detection device accuracy is required

Engineering Contradiction:
Improvealignment accuracyVSAvoiddetection device accuracy
Core Design Contradiction:
Manufacturing precisionVSMeasurement precision

Solution Approach 1:

The patent transitions from two-dimensional alignment parameters (simple angle and extinction) to three-dimensional spectral parameter space (equivalent rotary angle spectrum, equivalent axis azimuth spectrum, and equivalent retardance spectrum), providing more comprehensive control over alignment accuracy and reducing dependence on single-point detection precision.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The patent performs preliminary detection of spectral parameters across the entire wavelength range before final alignment adjustment, allowing the system to identify and correct alignment errors proactively. The computer calculates target values in advance and guides the adjustment process, ensuring high accuracy even with limited detection device precision.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This method achieves high accuracy in aligning composite waveplates by sensitively controlling fluctuations in spectral curves, ensuring precise optical axis alignment even with limited detection device accuracy, simplifying the operation and enhancing the applicability in optical instrument design and measurement.

Implementation Method 1

A waveplate is also a crystal plate since it is generally produced from uniaxial or biaxial crystals (i.e. birefringent materials) such as quartz, mica, magnesium fluoride, gypsum, sapphire

Methodology Applied
Scientific EffectBirefringence: Birefringence

Implementation Method 2

it can introduce a phase shift (also called phase retardation) between two orthogonal components of a polarized light and can be used to modulate or detect polarization states of the polarized light

Methodology Applied
Scientific EffectPolarisation: Polarisation

Data Source

PatentUS9103667B2Alignment method for optical axes of composite waveplate
Publication Date: 2015.08.11 WUHAN EOPTICS TECH CO LTD
  • US9103667B2 patent drawing
  • US9103667B2 patent drawing
  • US9103667B2 patent drawing

AI summary

An alignment method for optical axes of a composite waveplate includes rotating a rotatable waveplate, which rotates about a central axis with respect to a fixed waveplate, and adjusting the rotation angle thereof until the differences between the spectral parameters of the composite waveplate and ideal spectral parameters are smaller than preset values.