Wavelength Division Multiplexing Board Fault Localization via Parameter Correlation

Resolve Bottlenecks,
Find Innovative SolutionsGenerate Solutions

Solution Overview

Problem

The accuracy of locating fault causes in wavelength division multiplexing board devices is low due to the complex structure and limited manual experience in correlating component parameters, leading to inefficient fault diagnosis in fiber-optic communication networks.

Innovation Solution

A method that determines correlations between running parameters and fault parameters by analyzing parameter values before a fault occurs, identifying target parameters with high correlation to the fault parameter, which are likely to cause the fault, thereby improving fault cause localization accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual check by physical connection relationship and preset impact relationship is used, then fault cause location can be performed, but accuracy is relatively low due to complex structure and limited manual experience

Engineering Contradiction:

Improvefault cause location accuracyVSAvoidcomponent structure complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces manual physical inspection with automated parameter correlation analysis. By collecting parameter data from multiple components and automatically calculating correlations, the system eliminates the need for manual checking of physical connections and preset impact relationships, thereby improving accuracy while handling the complex structure systematically

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system performs self-diagnosis by automatically analyzing parameter correlations to identify fault causes. The automated correlation calculation and fault location process eliminates dependency on manual expertise, allowing the system to independently locate faults based on data-driven correlations between component parameters

Inventive Principle:

Principle #25Self-service

2Productivity

If manual check by physical connection relationship and preset impact relationship is used, then fault cause location can be performed, but efficiency is low due to limited manual experience

Engineering Contradiction:

Improvefault diagnosis efficiencyVSAvoidtime for manual fault location

Core Design Contradiction:

ProductivityVSLoss of time

Solution Approach 1:

The system continuously collects parameter data from all components and maintains updated correlation relationships. This continuous data gathering and analysis process eliminates the need for repeated manual inspections, enabling rapid fault location whenever issues occur by querying pre-established parameter correlations

Inventive Principle:

Principle #20Continuity of useful action

Solution Approach 2:

The patent replaces time-consuming manual inspection with automated parameter correlation analysis. The system automatically calculates and stores correlation relationships between component parameters, enabling rapid fault diagnosis through data query and analysis rather than manual checking, significantly reducing fault location time

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Data Source

PatentEP3667952B1Method, device, and storage medium for locating failure cause

Publication Date: 2021.10.27 HUAWEI TECH CO LTD

Figure 1~2
Figure 3~4
Figure 5

AI summary

Embodiments of the present invention disclose a method and an apparatus for locating a fault cause, and a storage medium. The method includes: obtaining parameter values of a plurality of running parameters and a parameter value of a fault parameter in preset duration before a wavelength division multiplexing board device is faulty, where the fault parameter is a parameter that is abnormal when the wavelength division multiplexing board device is faulty; determining a correlation between each of the plurality of running parameters and the fault parameter based on the parameter values of the plurality of running parameters and the parameter value of the fault parameter, where the correlation represents a correlation degree between a parameter value change of a running parameter and a parameter value change of a fault parameter; and determining at least one target parameter from the plurality of running parameters based on a value of the correlation, where a correlation between each of the at least one target parameter and the fault parameter is greater than a correlation between the fault parameter and a running parameter other than the at least one target parameter in the plurality of running parameters. Accuracy of locating a fault cause can be improved in the embodiments of the present invention.