WEDM Calibration Artifact for Probe-Wire Offset Alignment
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Solution Overview
Problem
Existing WEDM systems face challenges in accurately calibrating the position of the touch probe and conductive wire relative to the machine coordinate system, leading to inefficiencies in machining complex components like aircraft propulsion system parts.
Innovation Solution
A machining system incorporating a WEDM assembly, a probe assembly, and a calibration artifact, with a controller that identifies and calibrates the positions of the touch probe and conductive wire using a calibration artifact to determine X, Y, and Z offsets, allowing precise alignment in the machine coordinate system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional calibration methods are used for WEDM systems, then the calibration process is simple, but the measurement precision and manufacturing precision of the touch probe and conductive wire positions are insufficient
Solution Approach 1:
A calibration artifact with precisely engineered cavities (probe cavity and wire cavity) is introduced as an intermediary standard. The touch probe contacts surfaces within the probe cavity while the conductive wire contacts surfaces within the wire cavity, providing known reference positions for calibration. This mediator enables accurate determination of offset values between the touch probe and conductive wire positions without requiring direct measurement between these components.
2Productivity
If multiple separate calibration artifacts are used for touch probe and conductive wire, then each component can be calibrated independently, but the calibration time and process complexity increase
Solution Approach 1:
The calibration artifact integrates both the probe cavity and wire cavity into a single standardized component. This merged artifact allows simultaneous calibration of both the touch probe and conductive wire using one reference standard, eliminating the need for multiple separate calibration artifacts and reducing the overall calibration time while maintaining comprehensive calibration coverage.
Solution Approach 2:
The calibration artifact is designed with multi-functionality, serving as a universal reference standard for calibrating both touch probe positions and conductive wire positions. The artifact contains multiple cavities with precisely located contact surfaces that can accommodate different calibration operations, making it a versatile tool that replaces multiple specialized calibration standards.
Data Source
AI summary
A machining system includes a WEDM assembly, a probe assembly, a calibration artifact, and a controller. The WEDM assembly includes a conductive wire. The conductive wire extends between and to the upper guide head and the lower guide head. The probe assembly includes a touch probe. The calibration artifact includes an artifact body forming a probe cavity and a wire cavity. The controller is configured to identify a probe X-position and a probe Y-position of the touch probe by controlling the WEDM assembly to move the touch probe to contact the calibration artifact with the touch probe disposed within the probe cavity, identify a wire X-position and a wire Y-position of the conductive wire by controlling the WEDM assembly to move the conductive wire to contact the calibration artifact with the conductive wire disposed within the wire cavity, and calibrate the machining system by determining an X-offset and a Y-offset of the conductive wire relative to the touch probe and storing the X-offset and the Y-offset.