Wheatstone Bridge Sensor Offset Calculation via Node Resistance

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Solution Overview

Problem

Existing methods for calculating the offset of Wheatstone bridge type sensors are cumbersome and require individual measurement for each sensor, making them time-consuming and costly, especially since offset voltages vary with bias current.

Innovation Solution

A method and apparatus that calculate the offset of Wheatstone bridge type sensors using measured resistances between nodes, expressed as an equation independent of bias current, simplifying the calculation to (RA−RB+RC−RD)/2, where RA, RB, and RC are resistances between nodes, allowing for rapid and cost-effective offset determination.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If individual measurement is performed for each sensor to determine offset, then measurement precision is improved, but productivity deteriorates due to time-consuming processes

Engineering Contradiction:
Improveoffset measurement precisionVSAvoidsensor fabrication productivity
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The invention changes the measurement parameter from offset voltage (which varies with bias current) to inter-node resistance values. By measuring resistances RA, RB, RC, and RD between nodes and using the formula (RA−RB+RC−RD)/2, the offset can be calculated independently of bias current, enabling rapid calculation without individual voltage measurements for each sensor.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If complex measurement and calculation procedures are used to determine offset, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveoffset calculation accuracyVSAvoidmeasurement instrumentation complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention extracts the essential information needed for offset calculation by measuring only the four inter-node resistance values (RA, RB, RC, RD). This extraction approach eliminates the need for complex voltage measurements under different bias currents and amplifier connections, simplifying the measurement instrumentation while maintaining calculation accuracy through the resistance-based formula.

Inventive Principle:
Principle #2Taking out (Extraction)

3Manufacturing precision

If individual offset measurement is performed for each sensor type and configuration, then manufacturing precision is improved, but loss of time increases due to repeated measurements

Engineering Contradiction:
Improveoffset calibration precisionVSAvoidoffset measurement time
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The invention creates a universal offset calculation method that works for all Wheatstone bridge type sensors regardless of their specific configuration or sensor type (magnetic sensors, current sensors, etc.). The resistance-based formula (RA−RB+RC−RD)/2 is universally applicable to any sensor with a Wheatstone bridge structure, eliminating the need for separate calibration procedures for different sensor types and configurations.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS10310050B2Method and apparatus for calculating offset of wheatstone bridge type sensor
Publication Date: 2019.06.04 KOREA ELECTRONICS TECH INST
  • US10310050B2 patent drawing
  • US10310050B2 patent drawing
  • US10310050B2 patent drawing

AI summary

A method and an apparatus for calculating an offset of a Wheatstone bridge type sensor are described. The offset calculation method includes measuring resistances between nodes of a Wheatstone bridge type sensor, calculating an offset of the sensor using the measured resistances and providing information on the calculated offset. Accordingly, the offset of the Wheatstone bridge type sensor can be rapidly and easily calculated independently from the size of a bias current, and ultimately. Furthermore, time required to measure can be reduced and thus a sensor fabrication cost can be reduced, and also, mass production can be enhanced.