Wide-Width Surface Measurement With Separated Line-Beam Reflections
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Solution Overview
Problem
Conventional surface measurement apparatuses struggle to accurately measure objects with wide widths due to overlapping reflected images and unirradiated regions, which leads to measurement inaccuracies and omissions.
Innovation Solution
A surface measurement apparatus and method utilizing multiple light sources arranged to emit line beams in a width direction, controlling their emission states, including timing and wavelengths, to prevent overlapping reflected images on a screen, ensuring distinguishable projections and complete irradiation of the object's surface.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of moving object
If a single light source is used, then the apparatus configuration is simple, but it cannot emit line beam with sufficient width to measure wide-width objects
Solution Approach 1:
The patent divides the single light source into multiple light sources (N≥2) arranged in the width direction. Each light source emits a line beam, and their combined irradiation covers the entire width of wide-width objects, resolving the limitation of single light source irradiation width while maintaining manageable system complexity through modular arrangement.
2Length of moving object
If multiple light sources are simply arranged along the width direction, then the irradiation width is increased, but the reflected images overlap on the screen causing measurement failure
Solution Approach 1:
The patent resolves the overlapping problem by introducing angular separation in the moving direction. Light sources are arranged with different incident angles relative to the object surface, causing reflected images to project to different positions on the screen along the moving direction axis, thus preventing overlap while maintaining wide coverage.
Solution Approach 2:
The patent employs asymmetric arrangement of light sources where each light source has a specific incident angle designed to create non-overlapping reflection patterns. The incident angles are deliberately made different for adjacent light sources, creating an asymmetric configuration that separates reflected images in the moving direction while covering the full width.
3Measurement precision
If multiple light sources are used with different incident angles, then reflected images are separated on the screen, but the apparatus configuration and alignment become more complex
Solution Approach 1:
The patent systematically varies the incident angle parameter for each light source in the array. By establishing a clear parameter relationship where adjacent light sources have incrementally different incident angles, the system achieves automatic image separation without requiring complex individual adjustment mechanisms for each light source.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively prevents unmeasurable regions and measurement omissions, enabling reliable surface measurement of wide-width objects by ensuring non-overlapping and comprehensive illumination.
Implementation Method 1
line beam emitted from a light source is reflected on the surface of a moving object to be measured, a reflected image projected on a screen is captured by an image capturing device
Data Source
AI summary
To reliably measure a surface of an object to be measured having a wide width. A surface measurement apparatus that measures a surface of an object to be measured moving in a predetermined moving direction on a plane or a surface of an object to be measured moving in a predetermined moving direction along a curved surface of a roll, the surface being along the curved surface, the apparatus includes: N (N being an integer of two or more) light sources provided in a width direction, the light sources each emitting line beam over the width direction, which is a direction perpendicular to the moving direction; a screen on which reflected images of N pieces of the line beam reflected on reflection regions of the surface of the object to be measured respectively are projected; an image capturing device that captures the reflected image projected on the screen and acquires a captured image; and an arithmetic processing device that measures the surface of the object to be measured by using the captured image, in which the reflected images are projected on the screen to be distinguishable from each other.