Wire Electromigration Stress Ranking for Circuit Reliability
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Solution Overview
Problem
Complex electronic circuits with thousands or millions of interconnections are prone to malfunction due to electromigration, which current density alone cannot accurately predict, especially in complex wire geometries, making it difficult to identify and mitigate susceptible wires effectively.
Innovation Solution
A system and method that determine electromigration stress for each wire path in a circuit, ranking wires by their susceptibility to electromigration damage, allowing for targeted adjustments such as widening or shortening wire segments to mitigate damage, using a computer-implemented system to identify and prioritize wires for adjustment based on electromigration stress rather than current density.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If current density alone is used to predict electromigration, then the prediction process is simple, but the prediction accuracy is insufficient especially in complex wire geometries
Solution Approach 1:
The wire is divided into multiple wire segments, and electromigration stress is calculated for each segment individually. This segmentation allows the system to account for geometric variations along the wire path while maintaining a systematic calculation approach that scales with complexity.
Solution Approach 2:
The patent applies local quality by considering the specific geometry and characteristics of each wire segment separately. Each segment's electromigration stress is determined based on its local properties (length, orientation, connectivity), allowing accurate prediction for complex geometries without requiring a completely different approach for each case.
2Reliability
If all wires in a complex circuit are analyzed for electromigration, then comprehensive coverage is achieved, but the computational complexity and time increase significantly
Solution Approach 1:
The patent extracts and identifies only the critical wires that require electromigration analysis based on circuit characteristics. By selecting a subset of wires for detailed analysis rather than analyzing all wires equally, the system achieves comprehensive coverage of critical paths while reducing overall computational time.
Solution Approach 2:
The system performs preliminary identification and ranking of wires before conducting detailed electromigration analysis. This preliminary action prioritizes wires based on their susceptibility to electromigration, allowing the analysis to focus on the most critical wires first and reducing the time required to achieve reliable results.
3Ease of manufacture
If wire geometry is simplified for electromigration calculation, then the calculation is easier, but the accuracy for complex wire paths decreases
Solution Approach 1:
Complex wire paths are segmented into multiple simpler segments, each of which can be calculated using standardized electromigration formulas. This segmentation maintains calculation simplicity while accurately representing the complex overall geometry by summing the effects of individual segments.
Solution Approach 2:
The patent handles complex wire geometries by introducing additional dimensional considerations in the calculation model. Instead of simplifying the geometry to basic shapes, the system incorporates the full spatial complexity of wire paths through multi-dimensional coordinate systems and path integration, maintaining both accuracy and calculability.
Data Source
AI summary
Systems and methods are provided for identifying a wire of a plurality of wires to be adjusted to mitigate effects of electromigration. A segment electromigration stress value for each segment of a wire is determined for a wire of a circuit in a circuit design. A wire electromigration stress value for the wire is determined as a function of the segment electromigration stress values of segments of the wire. A ranked list of two or more wires of the circuit is displayed according the wire electromigration stress values of the two or more wires.