Wireless Communication Device Failure Circuit Identification

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Solution Overview

Problem

Existing wireless communication device failure detection techniques cannot specify which circuit part is failing, only indicating the presence or absence of a failure.

Innovation Solution

A wireless communication device with a test signal generation unit, test signal reception unit, and test signal determination unit that transfers test signals through loopback circuits to determine if the test signals are normal, allowing for the identification of failing circuits by comparing signal values and strengths across different paths.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a simple transmission signal input method is used to detect failure, then the detection process is simple, but it is not possible to specify which circuit part is in failure

Engineering Contradiction:
Improvefailure detection processVSAvoidfailure location identification
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent divides the wireless communication device into multiple tested units (transmission circuit, reception circuit, antenna feed end, etc.) and assigns specific test signal paths to each unit. By segmenting the failure detection process into unit-specific tests, the system can identify which specific circuit part is failing while maintaining a systematic and manageable detection approach.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces a test signal as an intermediary element that can be selectively routed through different circuit paths. This test signal acts as a mediator to probe specific circuit units without requiring direct observation of the failing component, enabling precise failure location identification while keeping the detection process simple and non-invasive.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If multiple test signal paths are used to identify failing circuits, then failure location can be specified, but the device complexity increases

Engineering Contradiction:
Improvefailure location identificationVSAvoidtest signal transfer paths
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent designs the test signal transfer unit to perform multiple functions: it can route test signals through different paths, switch between testing various circuit units, and adapt to different test scenarios. This multi-functional design enables precise failure identification without requiring separate dedicated test equipment for each circuit unit, thereby controlling device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent combines the test signal generation, routing, and transfer functions into an integrated test signal transfer unit. By merging these functions into a single modular component, the system achieves precise failure location identification while avoiding the complexity of separate distributed test systems. The merged unit can be controlled through a unified interface, simplifying the overall device architecture.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS10505645B2Wireless communication device and determination method
Publication Date: 2019.12.10 RENESAS ELECTRONICS CORP
  • US10505645B2 patent drawing
  • US10505645B2 patent drawing
  • US10505645B2 patent drawing

AI summary

To discriminate between a circuit where a failure does not occur and a circuit where a failure might occur, a wireless communication device has tested units which belong to a transmission side circuit, tested units which belong to a reception side circuit, a test signal generation unit for generating a test signal, a test signal reception unit for receiving a test signal, a test signal determination unit for determining whether or not the test signal received by the test signal reception unit is normal, and test signal transfer units for transferring a test signal from the transmission side circuit to the reception side circuit.