Wireless Millimeter Wave Testing Apparatus for Multi-Path Electronic Devices
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current wireless integrated circuit testing systems face challenges in efficiently testing multiple transmit and receive paths, particularly at millimeter wave frequencies, due to high test time, resource requirements, and reliability issues with electrical connections.
Innovation Solution
A wireless testing apparatus and method utilizing a test interface, generator, and analysis module that leverage beam steering capabilities to vary beam directions, allowing for simultaneous or rapid testing of multiple paths without physical connections, using static antennas to reduce test time and increase reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conducted testing with multiple antenna ports is used, then testing completeness is improved, but test time and resource requirements increase significantly
Solution Approach 1:
The patent replaces the mechanical/electrical probing system with an optical wireless testing system. Instead of physically connecting multiple antenna ports to test equipment via probe cards, the invention uses optical beams to wirelessly transmit test signals to and from multiple antenna ports simultaneously, eliminating the need for physical connections and reducing test time while maintaining testing completeness
Solution Approach 2:
The patent implements a universal testing platform that can simultaneously test multiple antenna ports and multiple functional paths (transmit, receive, beam steering) using a single optical testing system. The system uses wavelength division multiplexing and code division multiplexing to handle multiple signals concurrently, allowing one testing apparatus to perform functions that would otherwise require multiple separate testing setups
2Reliability
If multiple antenna ports are connected for testing, then testing coverage is improved, but device complexity and test resource requirements increase
Solution Approach 1:
The patent replaces the complex mechanical connection system for multiple antenna ports with a wireless optical system. The optical testing system uses beam steering and optical switching to direct test signals to different antenna ports without requiring physical reconnection, thereby reducing test system complexity while maintaining comprehensive testing coverage
Solution Approach 2:
The patent uses optical copying techniques where a single optical test signal can be replicated and distributed to multiple antenna ports simultaneously through optical splitting and beam distribution. This allows one test source to effectively become multiple test sources, covering all antenna ports without needing multiple physical test equipment units
3Ease of operation
If electrical connections are used for testing, then signal transmission is achieved, but connection stability and reliability deteriorate
Solution Approach 1:
The patent replaces electrical connections with wireless optical connections for signal transmission during testing. Optical beams transmit test signals between the testing apparatus and antenna ports without physical contact, eliminating connection stability issues such as contact resistance, oxidation, and mechanical wear while maintaining ease of signal transmission
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces test time and resource requirements while enhancing reliability by eliminating stability issues from electrical connections and enabling simultaneous testing of multiple paths, thereby improving the yield of faultless devices.
Implementation Method 1
The test module is configured to determine a plurality of transmit values of a transmit parameter wirelessly based on the test signal received from the electronic device by using at least one static antenna of the test module for receiving the test signal
Implementation Method 2
The test module is further configured to transmit a test signal through at least one antenna of the test module to the electronic device
Data Source
AI summary
An apparatus for wireless testing, wherein the apparatus includes a test interface, a test generator, a test module, and an analysis module. The test interface is coupled to an electronic device and is configured to transmit data to the electronic device and to receive data from the electronic device. The test generator drives the electronic device through the test interface to vary the beam direction. The test module determines a plurality of transmit values of a transmit parameter based on the test signal wirelessly received from the electronic device using at least one static antenna for receiving the test signal. Each transmit value of the transmit parameter is associated with a different beam direction. The analysis module provides an assessment of the plurality of transmit paths of the electronic device based on the plurality of transmit values.