Wireless Test System Channel Hopping for Low Energy Device Testing
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Solution Overview
Problem
Existing test systems for electronic devices with low energy wireless connections face challenges in maintaining reliable connections at low signal levels, often requiring physical connections that are time-consuming and restrictive, especially when devices lack ports for physical connections, leading to incomplete testing at very low signal levels.
Innovation Solution
A test system utilizing a wireless connection based on a low energy protocol with multiple channels that employ a channel hopping technique, where the RF level of non-test channels is kept higher than the test channel to maintain connectivity, allowing for reliable testing of low energy communication properties without physical connections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a physical connection is used to control the electronic device during testing, then the control and testing can be performed reliably, but the testing process becomes time-consuming and restrictive
Solution Approach 1:
The patent replaces the mechanical cable connection system with a wireless communication system. The test instrument and device under test communicate via wireless signals (e.g., Bluetooth Low Energy), eliminating the need for physical cable connections while maintaining reliable control and data transmission capabilities.
Solution Approach 2:
The patent introduces a wireless communication protocol as an intermediary between the test instrument and the device under test. This intermediary enables reliable communication without direct physical contact, allowing testing to proceed without the time-consuming process of connecting and disconnecting cables.
2Measurement precision
If the RF level of the test channel is reduced to test low signal levels, then the testing accuracy for low energy communication is improved, but the wireless connection may be lost
Solution Approach 1:
The patent divides the communication channels into two distinct segments: test channels and control channels. Test channels operate at low RF levels to accurately test low signal level performance, while control channels operate at higher RF levels to maintain reliable wireless connection and control functionality.
Solution Approach 2:
The patent applies different quality characteristics to different channels: test channels are optimized for low signal level accuracy with reduced RF power, while control channels are optimized for connection stability with higher RF power. This local differentiation allows simultaneous achievement of both testing accuracy and connection reliability.
3Reliability
If multiple channels are used for communication, then the ability to maintain connection at low signal levels is improved, but the device complexity increases
Solution Approach 1:
The patent implements multi-functional channel usage where channels serve dual purposes: control channels maintain connection reliability while also being capable of data transmission, and test channels perform low signal level testing while following the same channel hopping protocol. This universality reduces overall system complexity despite multiple channels.
Solution Approach 2:
The patent employs channel hopping technique where both test and control channels follow a periodic hopping pattern. This periodic action simplifies channel management by providing predictable, repeating sequences rather than requiring complex adaptive channel selection algorithms.
Data Source
AI summary
A test system for testing a device under test is described. The test system includes a testing circuit and the device under test. The testing circuit is configured to establish a wireless connection with the device under test based on a wireless communication standard having a low energy protocol. The wireless connection includes a plurality of channels, wherein the plurality of channels is configured to transmit data packages between the testing circuit and the device under test. The testing circuit and the device under test are configured to communicate with each other via the plurality of channels by a channel hopping technique. A radio frequency (RF) level of a signal transmitted by the testing circuit in at least one test channel to be tested, which belongs to the plurality of channels, is lower than an RF level of a signal transmitted by the testing circuit in at least one other channel of the plurality of channels. Further, a test method of testing a device under test is described.