Memory Word Line Pulse Timing for RC-Variant Read Margins

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Solution Overview

Problem

As semiconductor integrated circuits become smaller and more complex, the resistance of conductive lines affects line voltages and overall IC performance, leading to inefficiencies in read operations of memory devices due to varying RC characteristics of bit lines.

Innovation Solution

A memory device is configured to generate word line signals with variable pulse widths based on the row address of the memory cell, reducing power consumption by tailoring the pulse width according to the length of bit lines, thereby optimizing read operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a fixed pulse width is used for word line signals, then the read operation is simple to implement, but power consumption increases and read margin consistency deteriorates due to varying bit line lengths

Engineering Contradiction:
Improvesimplicity of read operationVSAvoidpower consumption
Core Design Contradiction:
Ease of operationVSUse of energy by moving object

Solution Approach 1:

The patent applies dynamics by making the word line signal pulse width variable rather than fixed. The pulse width is dynamically adjusted based on the row address, which corresponds to the bit line length. This allows the system to optimize power consumption and read margin for each specific bit line length while maintaining operational simplicity through automated control.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the parameter of pulse width based on the row address. By varying the pulse width parameter according to the bit line length (encoded in the row address), the system achieves optimal power consumption and read margin for each row, resolving the contradiction between simplicity and efficiency.

Inventive Principle:
Principle #35Parameter changes

2Device complexity

If a fixed pulse width is used for word line signals, then the control mechanism is simple, but read margin consistency deteriorates due to varying bit line lengths

Engineering Contradiction:
Improvecontrol mechanism complexityVSAvoidread margin consistency
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies local quality by tailoring the pulse width specifically to each row's bit line length. Instead of using a uniform pulse width for all rows, the system assigns different pulse widths to different rows based on their specific bit line lengths, ensuring consistent read margin for each local condition while maintaining overall system reliability.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The system uses the row address as feedback information to determine the appropriate pulse width. The row address encodes information about the bit line length, and this feedback is used to automatically select the correct pulse width, ensuring consistent read margin without requiring complex manual control mechanisms.

Inventive Principle:
Principle #23Feedback

3Reliability

If a longer pulse width is used for all word lines, then read margin is ensured for all cells, but power consumption increases unnecessarily for shorter bit lines

Engineering Contradiction:
Improveread margin assuranceVSAvoidexcessive power consumption
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The patent applies partial action by providing just enough pulse width for each specific bit line length rather than using a uniform excessive pulse width for all rows. This ensures that each row receives the minimum necessary pulse width to achieve adequate read margin, avoiding unnecessary energy consumption for rows with shorter bit lines while maintaining reliability.

Inventive Principle:
Principle #16Partial or excessive action

4Loss of energy

If a shorter pulse width is used for all word lines, then power consumption is reduced, but read margin is insufficient for cells with longer bit lines

Engineering Contradiction:
Improvepower consumption reductionVSAvoidread margin sufficiency
Core Design Contradiction:
Loss of energyVSReliability

Solution Approach 1:

The system dynamically adjusts the pulse width based on the row address to ensure sufficient read margin for each specific bit line length. By making the pulse width variable rather than uniformly short, the system maintains reliability for longer bit lines while still achieving power consumption reduction compared to a fixed long pulse width approach.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS20250372135A1Memory device and method of operating the same
Publication Date: 2025.12.04 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250372135A1 patent drawing
  • US20250372135A1 patent drawing
  • US20250372135A1 patent drawing

AI summary

A memory device includes a memory cell array including a first memory cell coupled to a first word line and a second memory cell coupled to a second word line; and a word line driver coupled to the memory cell array and configured to drive the first and second word lines with a word line signal having a pulse. A leading edge of the word line signal pulse is delayed for the word line signal applied to the first word line relative to the word line signal applied to the second word line.