Work Function Material Protection in Wide Replacement Gate Electrodes
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Solution Overview
Problem
In semiconductor manufacturing, the deposition and recessing of work function metal in wide gate cavities often result in the complete removal of the metal from the center portion, leading to integration challenges where the work function metal does not remain in contact with the entire gate dielectric, especially when the gate cavity width is greater than the metal thickness.
Innovation Solution
A method is developed where a wide gate trench and a narrow gate trench are formed, with the work function material layer filling only the narrow trench. A dielectric material layer is deposited and planarized, then recessed to form a dielectric portion over the horizontal work function material layer in the wide trench, which acts as an etch mask to maintain the work function material's uniform thickness during recessing, ensuring it remains in contact with the dielectric.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Length of stationary object
If the gate cavity width is made greater than the work function metal thickness to accommodate wide gate electrodes, then the gate electrode width is improved, but the work function metal is completely removed from the center portion during recessing
Solution Approach 1:
A dielectric material layer is introduced as an intermediary between the work function metal layer and the etching process. This dielectric layer is deposited over the work function metal, patterned to expose only the edges, and serves as a protective mask during selective recessing. The dielectric intermediary prevents direct etching of the work function metal center portion, maintaining its uniform thickness while allowing the gate electrode width to be greater than the metal thickness.
2Area of stationary object
If the work function metal thickness is increased to maintain contact across wide gate cavities, then the contact coverage is improved, but the metal resistivity causes increased electrical resistance
Solution Approach 1:
The work function metal layer is configured with different thicknesses in different regions: thinner at the edges where it contacts the gate dielectric, and thicker in the center portion where it is protected by the dielectric mask. This local quality variation allows the metal to maintain contact coverage across wide gate cavities while minimizing overall resistance, as the current path primarily utilizes the conductive work function metal without requiring excessive thickness.
3Ease of manufacture
If conventional deposition and recessing is used in wide gate cavities, then the process simplicity is maintained, but the work function metal is completely removed from the center portion
Solution Approach 1:
The dielectric material layer is deposited and patterned in advance, before the recessing of the work function metal layer. This preliminary action creates a protective mask that prevents the work function metal from being completely removed during subsequent etching. The dielectric layer is formed, planarized, and recessed to expose only the work function metal edges, establishing a protective structure that maintains metal thickness uniformity throughout the wide gate cavity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach ensures that the work function material portion within the wide gate trench maintains a uniform thickness and remains in contact with the dielectric material, preventing its removal during recessing, thus addressing the issue of metal loss in wide cavities and ensuring consistent electrical properties.
Implementation Method 1
A work function material layer is formed on the gate dielectric
Implementation Method 2
A work function material layer is formed on the gate dielectric
Implementation Method 3
A dielectric material layer is deposited and planarized over the work function material layer
Implementation Method 4
The work function material layer is recessed employing the dielectric material portion as a part of an etch mask to form work function material portions
Data Source
AI summary
In a replacement gate scheme, after formation of a gate dielectric layer, a work function material layer completely fills a narrow gate trench, while not filling a wide gate trench. A dielectric material layer is deposited and planarized over the work function material layer, and is subsequently recessed to form a dielectric material portion overlying a horizontal portion of the work function material layer within the wide gate trench. The work function material layer is recessed employing the dielectric material portion as a part of an etch mask to form work function material portions. A conductive material is deposited and planarized to form gate conductor portions, and a dielectric material is deposited and planarized to form gate cap dielectrics.


