X-Ray Diffraction Sample Holder with Inert Gas and Z-Axis Positioning
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Solution Overview
Problem
Existing X-ray diffraction analysis methods struggle to accurately position samples, especially those sensitive to atmosphere and moisture, and maintain reliability over long measurement times, particularly for sulfide-based solid electrolytes in all-solid-state batteries.
Innovation Solution
A sample holder with a movable support part and inert gas flow system that allows precise sample positioning and shields the sample from atmosphere and moisture, using a housing part with a cover and gas inlet/outlet to maintain a controlled environment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If the sample is sealed in a specific space to prevent atmospheric exposure, then the sample protection from moisture is improved, but the measurement reliability deteriorates due to difficulty in continuous sealing during long measurement time
Solution Approach 1:
The patent introduces an inert gas (such as nitrogen or argon) into the sealed space to create an inert atmosphere that prevents moisture from reaching the sample. The gas inlet allows continuous supply of inert gas, while the gas outlet removes humid air, maintaining a moisture-free environment throughout the measurement process and ensuring both sample protection and measurement reliability.
Solution Approach 2:
The patent uses a pneumatic system with gas inlet and gas outlet to dynamically control the atmospheric composition inside the sealed space. By continuously flowing inert gas through the chamber, the system actively replaces humid air and maintains stable atmospheric conditions during long-term measurements, resolving the contradiction between sealing effectiveness and measurement reliability.
2Measurement precision
If the incident beam size is small for micro-X-ray diffraction analysis, then the analysis precision is improved, but the positioning accuracy worsens because it is difficult to adjust the Z-axis position
Solution Approach 1:
The patent transforms the static support structure into a dynamic one by introducing a movable support part that can be adjusted in the Z-axis direction. This allows real-time positioning of the sample to match the small incident beam size, enabling both high analysis precision and accurate positioning by dynamically adapting the sample height during measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate sample positioning and long-term analysis of moisture-sensitive samples by preventing atmospheric and moisture exposure, enhancing measurement reliability and accuracy.
Implementation Method 1
a cover part configured to cover the upper portion of the housing part and to allow X-rays to pass therethrough
Implementation Method 2
generating a flow of an inert gas in the inner space by allowing the inert gas to flow into the gas inlet and discharging the inert gas through the gas outlet
Data Source
AI summary
Disclosed are a sample holder for X-ray diffraction analysis and an X-ray diffraction analysis method using the same. The sample holder for X-ray diffraction analysis includes a housing part formed of a side wall and a bottom plate with an open upper portion thereof, the housing part including an inner space partitioned from the side wall and the bottom plate, a cover part configured to cover the upper portion of the housing part and to allow X-rays to pass therethrough, and a support part installed to be movable upwards and downwards in the inner space, the support part including a plate-shaped substrate having a predetermined area, the substrate having a sample placed thereon.