X-Ray Imaging System Angle Alignment via Laue Diffraction
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Solution Overview
Problem
Existing x-ray imaging systems face limitations in achieving accurate alignment of optical elements due to the spatial resolution of detectors, requiring additional equipment during operational image acquisition, which is inefficient and imprecise.
Innovation Solution
The Laue method is employed to determine the orientation of optical elements using a reference sample with a known crystal structure, forming a diffraction pattern on the detector to compare with target images, enhancing alignment accuracy beyond detector resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If laser pointer systems or ghost-based alignment techniques are used, then the alignment process can be performed, but the measurement precision is limited by the spatial resolution of the detector
Solution Approach 1:
The patent introduces a reference sample with known crystal structure as an intermediary element between the x-ray source and detector. This reference sample enables precise alignment measurement by providing a diffraction pattern that serves as a reference, allowing alignment accuracy to exceed the detector's spatial resolution through comparative analysis of diffraction patterns.
Solution Approach 2:
The patent changes the measurement parameter from direct spatial positioning (limited by detector resolution) to diffraction pattern analysis. By measuring the angles of diffraction patterns and comparing them with reference patterns, the system achieves sub-detector-resolution alignment accuracy through angular measurement rather than direct spatial measurement.
2Measurement precision
If dedicated alignment equipment is used, then alignment can be performed, but additional equipment is required during operational image acquisition which reduces productivity
Solution Approach 1:
The patent makes the reference sample serve multiple functions: it acts as both an alignment reference and a valid imaging sample. The same reference sample used for alignment can be imaged using the Laue method, eliminating the need for separate dedicated alignment equipment and allowing alignment verification during normal operational phases.
Solution Approach 2:
The system performs self-alignment verification by using the reference sample's diffraction pattern as its own reference. The alignment measurement is performed by the system itself using the reference sample, without requiring external alignment equipment, thereby maintaining productivity during alignment operations.
3Ease of operation
If ghost-based alignment is used, then alignment can be determined, but the accuracy is limited to detector spatial resolution
Solution Approach 1:
The patent replaces mechanical alignment methods (laser pointers, physical ghosts) with x-ray diffraction-based alignment. Instead of using mechanical reference objects that are limited by detector resolution, the system uses the wave nature of x-rays and diffraction patterns to achieve superior alignment accuracy through angular measurement of diffraction spots.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method allows for precise alignment of x-ray imaging systems with improved accuracy, utilizing a minimal number of additional optical elements and reducing reliance on detector spatial resolution.
Implementation Method 1
an x-ray source (11), arranged to emit a polychromatic x-ray beam (14)
Implementation Method 2
the x-ray beam (14) passes through a reference sample (22) and forms a diffraction pattern on a sensing area (131) of an x-ray detector (13)
Data Source
AI summary
A device and method for measuring angles of orientation of an x-ray imaging system including an x-ray source, an x-ray detector and a sample holder arranged to receive a sample to be analysed. The method includes: emitting a polychromatic x-ray beam through a reference sample installed on the sample holder in order to form a diffraction pattern on the sensing area of the x-ray detector, generating, with the x-ray detector, an observed image comprising the diffraction pattern, and determining the orientation of the x-ray source and the orientation of the x-ray detector by comparing the observed image with at least one target image comprising a diffraction pattern obtained for the reference sample with preset orientations of the x-ray source and of the x-ray detector.