X-ray Scatter Detector Array for Combined Transmission and Diffraction Imaging
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Solution Overview
Problem
Current security detection systems face limitations in multiview transmission imaging and X-ray diffraction imaging, including limited information from two or three X-ray source perspectives, increased false positives due to low photon reception in XDI, and the need for separate systems which increase size, cost, and time for investigations.
Innovation Solution
An X-ray scatter detection system with an X-ray source emitting a pencil beam and a secondary collimator ensuring constant scatter angles for detector strips, allowing for improved photon reception and reduced angular broadening, enabling combined multiview transmission imaging and XDI in a single system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If angular broadening of scatter angle is increased to increase photon reception at detector element, then number of photons received increases, but measured peak widths of momentum transfer increase which decreases material detection rate
Solution Approach 1:
The detector is divided into multiple detector elements arranged in an array, where each element receives scattered radiation at a specific scatter angle. This segmentation allows the system to collect photons across multiple discrete angle measurements without requiring excessive angular broadening at any single detector element, thereby maintaining peak resolution while increasing total photon collection.
Solution Approach 2:
The patent transitions from a single detector element measuring a broad angular range to a two-dimensional array of detector elements, each measuring a narrow angular range. This dimensional expansion allows the system to achieve both high photon collection (by utilizing many elements) and high measurement precision (by keeping each element's angular acceptance narrow).
2Adaptability or versatility
If separate AT and XDI scanning systems are implemented to obtain advantages of both techniques, then detection capabilities are improved, but system size and cost increase
Solution Approach 1:
The patent combines multiview transmission imaging and X-ray diffraction imaging into a single integrated system. The same X-ray source and detector array serve both functions: transmission imaging is performed by detecting photons that pass through the container, while XDI is performed by detecting scattered photons at various angles. This merging eliminates the need for separate scanning systems, reducing overall system size and complexity.
Solution Approach 2:
The detector array is designed to perform multiple functions: it detects transmitted photons for multiview imaging and scattered photons for XDI simultaneously. The X-ray source also serves both imaging modes. This multi-functionality allows a single system to provide both transmission-based structural imaging and diffraction-based material identification capabilities.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances material detection rates, reduces false positives, and integrates both imaging techniques into a single system, decreasing size, cost, and investigation time while maintaining high detection accuracy for various materials.
Implementation Method 1
an X-ray source, a secondary collimator, and a scatter detector... said scatter detector is configured to receive scattered radiation having a scatter angle from the X-ray pencil beam
Implementation Method 2
said secondary collimator is configured to facilitate ensuring that a portion of the scattered radiation arriving at said scatter detector has a constant scatter angle with respect to the X-ray pencil beam
Implementation Method 3
by measuring d-spacings between lattice planes of micro-crystals in materials
Data Source
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AI summary
An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width.