XML-Encoded Semiconductor Test Data Storage and Retrieval
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The semiconductor manufacturing process faces challenges in efficiently storing and retrieving large amounts of test data generated during fabrication, which hinders timely access and increases production costs, while current methods fail to provide flexible data access and maintain quality control.
Innovation Solution
A tester information processing system that uses a markup language encoder to store test data in an object-oriented database management system, enabling timely access and creating object-oriented test data documents, thereby reducing testing time and maintaining quality control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If test data is stored using current methods, then data storage is achieved, but data retrieval is slow and inflexible
Solution Approach 1:
The patent segments test data into structured hierarchical categories (wafer level, die level, device level, parameter level) using XML markup language. This segmentation enables targeted retrieval of specific data elements without requiring access to entire datasets, dramatically improving retrieval speed while reducing time loss.
Solution Approach 2:
The patent introduces XML markup language as an intermediary layer between test equipment and database storage systems. This intermediary structures raw test data into standardized, queryable formats, enabling flexible and rapid data access without requiring changes to underlying storage infrastructure.
2Productivity
If more engineers are hired to analyze test data, then data analysis capability increases, but production cost increases
Solution Approach 1:
The patent implements self-service through automated XML-based data structuring and retrieval systems. The system automatically organizes, stores, and retrieves test data without requiring manual intervention from engineers, thereby maintaining high data analysis productivity while eliminating the need to hire additional personnel.
Solution Approach 2:
The patent changes the parameter of data organization from unstructured or semi-structured formats to standardized XML markup structures. This parameter change enables automated processing and retrieval of test data, significantly improving analysis productivity without increasing headcount or production costs.
3Loss of time
If testing time is reduced, then production cost decreases, but data storage and retrieval efficiency must be improved
Solution Approach 1:
The patent implements a universal XML-based data storage and retrieval system that handles multiple types of test data (wafer-level, die-level, device-level, parameter-level) through a single standardized framework. This multi-functional approach reduces testing time by enabling rapid access to any data type while avoiding the complexity of multiple separate storage systems.
4Adaptability or versatility
If current data storage methods are used, then data is stored, but flexible access to test data is not provided
Solution Approach 1:
The patent applies preliminary action by pre-structuring test data into hierarchical XML categories during the data generation phase. This preliminary organization enables flexible access to any level of data (wafer, die, device, parameter) without requiring complex queries or data manipulation, thereby preventing loss of information accessibility while maximizing adaptability.
Data Source
AI summary
A tester information tester information processing system provides test equipment for generating test data. A markup language encoder connected to the test equipment encodes the test data for storage in an object-oriented database management system connected to the markup language encoder, and a user interface is operatively connected to the object-oriented database management system for retrieval of the test data.