Exclusive-NOR Gate Array for Parallel Pattern Recognition
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Solution Overview
Problem
Conventional computers using serial processes for pattern recognition are bottlenecked by machine cycles, leading to inefficiencies in compute-intensive applications like artificial intelligence.
Innovation Solution
The method employs an array of interconnected exclusive-nor logic gates to store and compare patterns in parallel, using electrical inputs to determine pattern matching with greater performance than traditional methods.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If conventional computers use serial processes for pattern recognition, then the system structure is simple, but the processing speed is slow and performance is limited by machine cycles
Solution Approach 1:
The patent segments the pattern recognition task into multiple parallel comparison operations using an array of exclusive-nor logic gates. Each gate independently compares corresponding bits of the input pattern with stored patterns, enabling simultaneous multi-bit comparison that dramatically increases processing speed while maintaining manageable system complexity through modular organization
Solution Approach 2:
The patent transitions from serial single-bit comparison to parallel multi-dimensional comparison by utilizing an array of logic gates operating simultaneously. This dimensional expansion from sequential to parallel processing architecture enables the system to evaluate multiple pattern bits concurrently, overcoming the speed limitations of traditional serial processors
2Productivity
If parallel processing is implemented using an array of exclusive-nor logic gates, then pattern recognition performance increases, but the device complexity increases
Solution Approach 1:
The patent employs exclusive-nor logic gates that serve multiple functions: they simultaneously perform bit comparison, generate match signals, and contribute to the overall pattern matching decision. This multi-functionality reduces the need for separate dedicated components for each operation, thereby increasing productivity while controlling device complexity
Solution Approach 2:
The patent uses identical copies of the exclusive-nor logic gate structure across the array, with each gate performing the same comparison function on different input bits. This replication of a simple, well-understood logical unit enables parallel processing and high throughput while keeping individual gate complexity low and the overall system design manageable through standardization
Data Source
AI summary
Invention for pattern recognition and artificial intelligence comprising:1) storing data in parallel by applying a logic level (1) input or a logic level (0) input to one input of each of at least two exclusive-nor logic gates;2) comparing data in parallel by applying a logic level (1) input or a logic level (0) input to the other input of each of the exclusive-nor gates, wherein each exclusive-nor gate produces a logic level (1) output when both inputs have the same datum input, and each exclusive-nor gate produces a logic level (0) output when both inputs have different datum input; and3) measuring the outputs of the exclusive-nor logic gates collectively with a measuring apparatus, wherein the percentage of the pattern input for comparison which matches the pattern of data stored in the exclusive-nor gates is directly proportional to the magnitude of the collective output of the exclusive-nor gates.