Dual-Mode X-Ray Optical Sensor for Positioning
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Solution Overview
Problem
Conventional X-ray technologies require multiple exposures to obtain a quality image, leading to unnecessary radiation exposure and inefficiency due to the lack of positioning feedback for the X-ray sensor, resulting in prolonged and wasteful use of X-ray radiation.
Innovation Solution
A dual-mode X-ray and optical image sensor (XOIS) capable of capturing both X-ray and optical image data, featuring a semiconductor layer with an X-ray absorption layer and shield layers to limit X-ray exposure to sensitive components, allowing for initial optical imaging to optimize X-ray sensor placement before capturing X-ray images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple X-ray exposures are taken to obtain a quality image, then image quality is improved, but radiation exposure to the subject increases and time is wasted
Solution Approach 1:
The patent applies preliminary action by using optical imaging to determine sensor positioning and verify alignment before performing X-ray exposures. This preliminary optical assessment ensures that the X-ray sensor is correctly positioned in a single exposure, eliminating the need for multiple trial exposures and thereby reducing radiation exposure while maintaining image quality
2Measurement precision
If multiple X-ray exposures are taken to obtain a quality image, then image quality is improved, but time and resources are wasted
Solution Approach 1:
The system performs preliminary optical imaging to establish sensor positioning and alignment before X-ray exposure. This advance preparation ensures that the subsequent X-ray exposure is performed correctly on the first attempt, eliminating time-wasting trial-and-error procedures and improving overall imaging efficiency
3Measurement precision
If optical imaging is performed before X-ray imaging, then sensor positioning accuracy is improved, but device complexity increases
Solution Approach 1:
The patent merges optical imaging and X-ray imaging capabilities into a single integrated sensor device. The sensor includes both an optical detection layer and an X-ray detection layer, allowing the same physical device to perform both optical preliminary imaging and X-ray imaging, thereby improving positioning accuracy without significantly increasing overall device complexity
Solution Approach 2:
The imaging device is designed with multi-functionality, capable of performing both optical imaging and X-ray imaging functions. This universal device can first perform optical imaging for positioning verification, then perform X-ray imaging for the final diagnostic image, eliminating the need for separate devices and reducing overall system complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Reduces unnecessary X-ray exposure and increases efficiency by providing positioning feedback, enabling accurate placement of the X-ray sensor and minimizing radiation exposure to subjects while improving image capture efficiency.
Implementation Method 1
a plurality of photodiodes disposed in a semiconductor layer
Implementation Method 2
an X-ray absorption layer disposed between the semiconductor layer and the reflective layer
Implementation Method 3
a reflective layer disposed behind the X-ray absorption layer
Data Source
AI summary
An image sensor for capturing X-ray image data and optical image data includes an X-ray absorption layer and a plurality of photodiodes disposed in a semiconductor layer. The X-ray absorption layer is configured to emit photons in response to receiving X-ray radiation. The plurality of photodiodes disposed in the semiconductor layer is optically coupled to receive image light to generate the optical image data, and is optically coupled to receive photons from the X-ray absorption layer to generate X-ray image data.