Optical Parallelism Measurement for XR Metrology

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Solution Overview

Problem

Current optical measurement tools, such as collimators, wavefront sensors, and interferometers, are inadequate for accurately measuring optical parallelism in extended reality (XR) devices due to limited field of view, sensitivity to environmental changes, and complexity, making it difficult to ensure precise alignment and manufacturing tolerances, especially for XR components with tight tolerances.

Innovation Solution

A compact optical system utilizing a single optical lens system with multiple apertures configured to determine parallelism by casting light rays as spots on an image plane, allowing for high angular accuracy and adaptability to different virtual imaging distances, and providing a larger field of view suitable for XR applications.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional optical measurement tools (collimators, wavefront sensors, interferometers) are used to measure optical parallelism, then measurement capability is provided, but measurement precision and field of view are limited

Engineering Contradiction:
Improveoptical parallelism measurement accuracyVSAvoidfield of view coverage
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent combines multiple aperture views into a single unified measurement system. Multiple apertures are arranged to capture light rays from different angles simultaneously, and their images are merged onto a single image plane, enabling both high precision measurement and extended field of view coverage without requiring multiple separate instruments.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The optical system is designed to measure optical parallelism across multiple aperture positions and angles using a single integrated system. The same lens system and image plane serve multiple measurement functions simultaneously, making the system versatile for different XR device configurations while maintaining measurement precision.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Measurement precision

If multiple optical components are used to achieve accurate parallelism measurement, then measurement accuracy improves, but device complexity increases

Engineering Contradiction:
Improveangular measurement accuracyVSAvoidoptical system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent merges multiple aperture observations into a single measurement system. Instead of using separate instruments for each aperture, the system combines multiple apertures, lenses, and image planes into one integrated optical assembly, reducing overall device complexity while maintaining measurement accuracy through the unified design.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

A single optical system performs multiple measurement functions simultaneously. The same optical components serve different apertures and measurement angles, eliminating the need for multiple specialized components and reducing system complexity while preserving angular measurement accuracy.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Device complexity

If a single optical lens system is used, then device complexity is reduced, but measurement precision for multiple angles may be compromised

Engineering Contradiction:
Improveoptical system simplicityVSAvoidmulti-angle parallelism measurement accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent segments the optical system into multiple apertures that each capture light rays from different angles. Each aperture acts as an independent measurement channel, allowing the single lens system to maintain precision for multiple angles by processing each angle's light rays separately through its dedicated aperture path.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent adds the dimension of multiple aperture positions to the single lens system. By arranging apertures in specific spatial configurations, the system captures angular information from different directions simultaneously, enabling a simple single-lens design to achieve multi-angle measurement precision that would otherwise require multiple complex optical systems.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables precise measurement of optical parallelism with high angular accuracy, accommodating various XR devices and systems, ensuring accurate alignment and image quality, and identifying misalignments effectively, thus enhancing the XR experience and manufacturing processes.

Implementation Method 1

a single optical lens system disposed between the front end and the rear end of the enclosure, wherein one of the first pair of apertures is configured to allow a first set of light rays into the enclosure through the single optical lens system to be cast on an image plane as a first spot

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentUS11971249B1Optical parallelism system for extended reality metrology
Publication Date: 2024.04.30 ML OPTIC CORP
  • US11971249B1 patent drawing
  • US11971249B1 patent drawing
  • US11971249B1 patent drawing

AI summary

An optical system including an enclosure including a front end and a rear end, a first pair of apertures configured to be disposed on a front plane on the front end of the enclosure and a single optical lens system disposed between the front end and the rear end of the enclosure, wherein the first pair of apertures are configured to allow sets of light rays into the enclosure through the single optical lens system to be cast on an image plane as first and second spots, the image plane being parallel to the front plane, if the first and second spots are concentrically disposed, the sets of light rays are determined to be parallelly disposed with respect to one another, otherwise the sets of light rays are determined to not be parallelly disposed with one another.