Fluorescent X-ray Analysis Apparatus Dual Inspection Positions
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Solution Overview
Problem
Current fluorescent X-ray analysis apparatuses face limitations in detecting trace elements, particularly cadmium in light elements, due to attenuation of primary X-rays through filters and spatial constraints, leading to reduced sensitivity and detection limits.
Innovation Solution
The apparatus employs a detachable sample holding tool and dual inspection positions to optimize X-ray irradiation and detection, allowing for high-density X-ray irradiation and efficient detection of fluorescent X-rays, regardless of the sample's composition, using a sample base with a window for positioning the X-ray source and detector and a secondary exciting wall to enhance X-ray intensity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a primary filter is used to absorb primary X-ray of plural energy bands, then the background intensity decreases, but the sensitivity decreases
Solution Approach 1:
The invention extracts and removes the primary filter component from the system. By eliminating the filter that was absorbing the primary X-ray, the patent prevents the attenuation of X-ray intensity while still achieving background reduction through alternative means (geometric arrangement and detector positioning), thereby resolving the contradiction between reducing background intensity and maintaining sensitivity.
2Reliability
If the X-ray source and detector are brought close to the irradiation position, then the sensitivity increases, but the separation distance becomes short due to spatial limitation
Solution Approach 1:
The invention transitions from a one-dimensional constraint (linear distance between source and detector) to a three-dimensional spatial arrangement. By positioning the detector at specific angular directions and utilizing vertical stacking of components, the patent achieves close proximity for high sensitivity while maintaining adequate separation through spatial dimensionality, resolving the contradiction between sensitivity enhancement and physical space requirements.
3Ease of operation
If the primary X-ray is directly irradiated to the sample, then the measurement is possible without pretreatment, but the detection lower limit is insufficient for trace elements in light element samples
Solution Approach 1:
The invention changes the parameters of the X-ray detection system by optimizing the energy characteristics of the primary X-ray source and the detection geometry. By adjusting these parameters to enhance X-ray intensity and reduce background noise, the patent achieves trace element detection capability in light element samples while maintaining the advantage of no sample pretreatment required.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration improves the detection lower limit and sensitivity, enabling accurate quantitative determination of trace elements in both heavy and light element samples, including cadmium in food samples, by efficiently detecting fluorescent X-rays without attenuation.
Implementation Method 1
an X-ray source (4) for irradiating a primary X-ray (P) to the sample (S)
Implementation Method 2
a detector (5) for detecting a fluorescent X-ray (Q) generated from the sample (S) to which the primary X-ray (P) has been irradiated
Implementation Method 3
by absorbing the primary X-ray of plural energy bands by the primary filter and irradiating the primary X-ray of a necessary energy band, it is possible to decrease the background intensity
Data Source
AI summary
There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit is improved, and it is possible to quantify a trace aimed element having been contained not only in a sample whose main component is a heavy element but also in a sample whose main component is a light element. The fluorescent X-ray analysis apparatus possesses a sample base supporting the sample, an X-ray source irradiating a primary X-ray with a predetermined irradiation position being made a center, and a detector disposed toward the irradiation position and detecting a fluorescent X-ray generated from the sample. The sample base has a detachable sample holding tool fixing the sample while being approached to the X-ray source and the detector, and a measurement is possible by selectively disposing the sample in any one of a 1st inspection position in which an irradiated face is coincided with the irradiation position, or a 2nd inspection position in which the sample is fixed to the sample holding tool, an irradiated face is approached to the X-ray source, and an inspected face is approached to the detector.