Adaptable X-ray Analysis Apparatus with Dynamic Focal Spot Control
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Solution Overview
Problem
Conventional X-ray analysis apparatuses require reconfiguration for different X-ray analysis applications, limiting their versatility and increasing the risk of anode damage due to the trade-off between focal spot size and operating power.
Innovation Solution
An X-ray analysis apparatus with a controller that selectively operates in multiple modes by adjusting the effective focal spot size and power based on the application, using a solid anode and focusing arrangement to accommodate various analysis types without reconfiguration, allowing for both micro-focus and larger focal spot operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a small focal spot size is used to accommodate micro-focus applications, then the X-ray tube can perform high-resolution analysis (e.g., 2D SAXS, GISAXS, micro-diffraction), but the maximum operating power is limited to relatively low levels, resulting in low intensity measurements
Solution Approach 1:
The patent implements dynamic switching between multiple focal spot sizes (e.g., micro-focus mode with <100 μm spot and macro-focus mode with larger spot) allowing the X-ray tube to adapt its operating characteristics based on the specific analysis application. This enables the system to optimize both resolution and power output by selecting the appropriate focal spot size for each measurement type.
Solution Approach 2:
The invention changes the focal spot size parameter dynamically through interchangeable anodes or adjustable focusing mechanisms. By varying this critical parameter, the system can transition between low-power high-resolution mode and high-power high-intensity mode, resolving the contradiction between measurement precision and operating power.
2Power
If a large focal spot size is used to enable high intensity measurements, then relatively high power settings can be used, but the X-ray tube cannot perform micro-focus applications requiring high resolution
Solution Approach 1:
The system dynamically adjusts the focal spot size based on the required measurement type. When high intensity measurements are needed, the system switches to a larger focal spot configuration that can accommodate higher operating powers while maintaining measurement capability.
Solution Approach 2:
The X-ray tube is designed with multi-functionality through interchangeable anodes or adjustable focusing systems that enable it to perform both micro-focus applications and high-intensity measurements with a single device, eliminating the need for separate specialized tubes.
3Reliability
If the anode surface temperature is kept much lower than the melting point to avoid damage, then the anode can operate reliably, but this limits the maximum power setting and thus the intensity of measurements
Solution Approach 1:
The system dynamically adjusts operating parameters including power settings based on the selected focal spot size and measurement type. By matching the power level to the appropriate focal spot configuration, the anode temperature is kept within safe limits while still enabling high-intensity measurements when using larger focal spots.
Solution Approach 2:
The invention changes operating parameters (power, current, voltage) in conjunction with focal spot size adjustments. This coordinated parameter change allows the system to maximize power output within the thermal constraints of the anode, achieving high intensity measurements without compromising reliability.
4Measurement precision
If an X-ray tube is selected based on a specific X-ray analysis application, then the tube can be optimized for that application, but the apparatus requires reconfiguration for different applications, limiting versatility
Solution Approach 1:
The X-ray tube incorporates multiple anodes with different focal spot characteristics or an adjustable focusing system that enables a single tube to perform multiple X-ray analysis applications (e.g., micro-diffraction, powder diffraction, fluorescence analysis) without requiring physical reconfiguration or replacement of the tube.
Solution Approach 2:
The system dynamically switches between different operational modes and focal spot sizes based on the selected analysis application. This dynamic adaptability allows the apparatus to maintain optimal performance across various applications while preserving versatility.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables versatile use of the X-ray analysis apparatus for multiple applications with minimal reconfiguration, protecting the anode by tailoring operating power to focal spot size, thereby enhancing operational convenience and longevity.
Implementation Method 1
The cathode is arranged to irradiate a surface of the anode with an electron beam, and X-rays are emitted from the irradiated area
Implementation Method 2
X-rays are emitted from the irradiated area
Implementation Method 3
a focusing arrangement for focusing the electron beam onto the anode
Implementation Method 4
analyse a sample by X-ray diffraction
Implementation Method 5
X-ray scattering
Implementation Method 6
X-ray fluorescence
Data Source
AI summary
The present invention relates to an X-ray analysis apparatus and a method of X-ray analysis. The X-ray analysis apparatus enables a user to carry out a plurality of X-ray analysis applications, for analysing a sample by measuring X-ray diffraction and/or X-ray fluorescence, using the same X-ray source. The apparatus comprises an X-ray source for irradiating the sample with X-rays, the X-ray source comprising a solid anode and a cathode for emitting an electron beam. It also comprises a focusing arrangement for focusing the electron beam onto the anode, and a controller. The controller is configured to receive X-ray analysis application information and to control the X-ray analysis apparatus to selectively operate in either a first X-ray analysis mode or a second X-ray analysis mode based on the X-ray analysis application information. In the first X-ray analysis mode the X-ray source operates at a first operating power and has an effective focal spot size that is less than 100 μm. In the second X-ray analysis mode the X-ray source operates at a second operating power that is higher than the first operating power, and the area of the effective focal spot is larger than the area of the effective focal spot in the first X-ray analysis mode.