Fluorescent X-ray Analysis Apparatus with Secondary Radiation Reduction
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Solution Overview
Problem
Current fluorescent X-ray analysis methods face challenges in achieving a low detection limit due to secondary X-ray scattering and fluorescence, leading to increased background intensity and count errors, which hinder the accurate quantification of trace elements like cadmium in samples.
Innovation Solution
The implementation of a fluorescent X-ray analysis apparatus with a collimator and secondary X-ray reduction layers to absorb secondary scattered and fluorescent X-rays, reducing unnecessary X-ray counts and improving sensitivity by effectively directing primary X-rays and fluorescent X-rays to the detector while minimizing secondary radiation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the intensity of the primary X-ray is increased to improve sensitivity, then the detection lower limit deteriorates due to increased secondary X-ray generation
Solution Approach 1:
The patent extracts and removes the harmful secondary X-rays from the detection path by using a detector configured to detect only X-rays from a specific solid angle direction, effectively separating the useful primary fluorescent X-rays from the harmful secondary scattered and fluorescent X-rays
Solution Approach 2:
The patent applies local quality by making the detector's detection capability direction-dependent, with high detection efficiency for X-rays from the sample direction and low detection efficiency for X-rays from other directions, thereby selectively detecting useful signals while rejecting harmful radiation
2Object-generated harmful factors
If a collimator is placed in front of the detector to suppress unnecessary X-rays, then the count of primary fluorescent X-ray detected decreases
Solution Approach 1:
The patent uses the incident angle as an intermediary parameter to distinguish between useful and harmful X-rays, detecting X-rays based on their angle of incidence rather than simply blocking them, thereby maintaining signal strength while filtering out unwanted radiation
Solution Approach 2:
The patent changes the detection parameter from total X-ray count to angle-resolved X-ray detection, using the incident angle as a discriminating parameter to separate primary fluorescent X-rays from secondary scattered and fluorescent X-rays without physical attenuation
3Measurement precision
If the count of detected X-rays is increased to improve statistical accuracy, then count errors increase and pileup occurs
Solution Approach 1:
The patent converts the potentially harmful high-count condition into a beneficial state by using angle-resolved detection to identify and count only primary fluorescent X-rays, transforming what would be pileup errors into accurate quantitative data for trace element analysis
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances the detection lower limit by reducing background intensity and count errors, allowing for more accurate quantification of trace elements by increasing the intensity of primary fluorescent X-rays detected.
Implementation Method 1
an irradiated face of the X-ray source or the detector, to which a primary scattered ray having generated by the fact that the primary X-ray scatters in the sample and the primary fluorescent X-ray having generated from the sample are irradiated, is covered by a secondary X-ray reduction layer reducing a secondary scattered ray and a secondary fluorescent X-ray
Implementation Method 2
a collimator having a through-hole in its center part has been placed in a front face of the detector, and in which, when the primary X-ray has been irradiated to a sample from the X-ray source, a primary fluorescent X-ray generating from the sample and passing through the through-hole of the collimator is detected by the detector
Implementation Method 3
an X-ray source irradiating a primary X-ray
Implementation Method 4
a primary fluorescent X-ray generating from the sample... by the fact that it excites elements forming the X-ray source, the outer periphery face of the detector or the like, a secondary fluorescent X-ray generates
Implementation Method 5
a detector detecting the fluorescent X-ray generated from the sample to which the primary X-ray has been irradiated
Implementation Method 6
by the fact that it excites the sample to thereby generate the fluorescent X-ray (primary fluorescent X-ray) and, by the sample, scatters to a periphery as a primary scattered ray
Data Source
AI summary
There is provided a fluorescent X-ray analysis apparatus in which a detection lower limit has been improved by reducing an X-ray generating subsidiarily and detected. The fluorescent X-ray analysis apparatus is one which possesses an X-ray source irradiating a primary X-ray, and a detector in which a collimator having a through-hole in its center part has been placed in a front face, and in which, by the detector, there is detected a primary fluorescent X-ray which generates from a sample by irradiating the primary X-ray to a sample, and passes through the through-hole of the collimator. The X-ray source and the detector are disposed while adjoining the sample, and an irradiated face of the X-ray source or the detector, to which a primary scattered ray having generated by the fact that the primary X-ray scatters in the sample and the primary fluorescent X-ray having generated from the sample are irradiated, is covered by a secondary X-ray reduction layer reducing a secondary scattered ray and a secondary fluorescent X-ray, which generate by irradiations of the primary scattered ray and the primary fluorescent X-ray.