X-ray Analysis Apparatus Wizard for Material-Driven Measurement Selection

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Solution Overview

Problem

Existing X-ray analysis apparatuses face difficulties in selecting the appropriate measurement method and optical system for specific materials, leading to suboptimal data collection and underutilization of available functionalities, especially for inexperienced operators.

Innovation Solution

An X-ray analysis apparatus equipped with measurement software and computation means that allows users to input material information, automatically select suitable evaluation methods, and optimize optical systems based on material characteristics, enabling accurate and efficient data collection across various measurement methods.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple measurement methods and optical systems are provided in the X-ray analysis apparatus, then measurement versatility is improved, but device complexity increases

Engineering Contradiction:
Improvemeasurement versatilityVSAvoidapparatus complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The X-ray analysis apparatus is designed with multiple measurement methods (diffractometer method, goniometer method, reflectometer method, small-angle scattering method) and various optical elements (monochromators, analyzers, slits, mirrors) that can be configured for different measurement purposes. This multi-functionality allows a single apparatus to perform diverse X-ray measurements across different material fields, resolving the contradiction by integrating versatility into the core design while managing complexity through systematic organization of components.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The apparatus divides the measurement system into separate functional modules: X-ray source, optical elements (monochromators, analyzers, slits), goniometer mechanisms, and detection systems. Each module can be independently configured or replaced based on measurement requirements. This segmentation allows the apparatus to achieve versatility through modular assembly while keeping individual components manageable in complexity.

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If the apparatus provides comprehensive measurement functions for various material fields, then adaptability is improved, but ease of operation deteriorates

Engineering Contradiction:
Improvematerial field coverageVSAvoidoperation difficulty
Core Design Contradiction:
Adaptability or versatilityVSEase of operation

Solution Approach 1:

A computer control system serves as an intermediary between the operator and the complex measurement system. The computer stores pre-configured measurement conditions for different material fields (semiconductor epitaxial films, polycrystal films, magnetic films, etc.) and automatically selects and configures the appropriate measurement method and optical elements based on the sample type. This intermediary eliminates the need for operators to manually navigate complex settings, resolving the contradiction by providing comprehensive material field coverage while maintaining ease of operation through automated selection.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

Measurement conditions, optical element configurations, and instrument parameters are pre-configured in the computer for various material fields and measurement types. Before actual measurement, the system automatically retrieves and applies the appropriate pre-configured settings based on the sample characteristics. This preliminary preparation of measurement protocols allows the apparatus to handle diverse material fields without requiring operators to manually configure complex parameters, thus maintaining ease of operation.

Inventive Principle:
Principle #10Preliminary action

3Ease of operation

If automatic measurement condition selection is implemented, then ease of operation is improved, but measurement precision may deteriorate

Engineering Contradiction:
Improveselection simplicityVSAvoiddata accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The computer control system incorporates feedback mechanisms that allow operators to review the automatically selected measurement conditions and make manual adjustments if needed. The system provides information about the selected measurement method, optical elements, and parameters, enabling operators to verify the appropriateness of automatic selections. This feedback loop ensures that while the system maintains ease of operation through automatic selection, measurement precision is preserved by allowing human oversight and correction when necessary.

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Facilitates the selection of the most suitable measurement functions for materials, ensuring effective utilization of the apparatus's capabilities and providing accurate data through simplified and reliable operation, even for inexperienced users.

Implementation Method 1

an X-ray generation device (16) installed on one side of the position at which the sample (S) is placed

Methodology Applied
Scientific EffectX-ray generation: X-Ray

Data Source

PatentUS9218315B2X-ray analysis apparatus
Publication Date: 2015.12.22 RIGAKU CORP
  • US9218315B2 patent drawing
  • US9218315B2 patent drawing
  • US9218315B2 patent drawing

AI summary

An X-ray analysis apparatus having a function for enabling a plurality of measurement methods to be implemented, the X-ray analysis apparatus having: a measurement system capable of implementing a plurality of measurement methods; measurement software for implementing, in a selective manner, each of the measurement methods; a material evaluation table for storing information relating to a material that may be measured, and a name of an evaluation performed on the material; an input device for inputting the information relating to the material; a wizard program for performing computation for selecting the name of an evaluation on the basis of the information relating to the material inputted using the input device; and a wizard program for selecting a corresponding measurement method on the basis of the selected name of the evaluation.