X-ray Analyzer Dual Observation System

Solution Overview

Problem

Existing X-ray analyzers face challenges in achieving high precision and sensitivity due to the need for a large optical system with a deep field of view, which increases the distance between the X-ray source and the sample, making precise distance measurement and quantitative analysis difficult, especially for uneven samples.

Innovation Solution

The X-ray analyzer employs a dual observation system configuration, where a first system with a large depth of field and wide view is used to specify the irradiation point, and a second system with a smaller depth of field and narrow view for precise distance measurement, allowing for focus adjustment and improved sensitivity by bringing the X-ray source closer to the sample.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If a large optical system with deep field of view is used to specify measurement position, then operability in specifying measurement point is improved, but distance between X-ray source and sample increases

Engineering Contradiction:

Improveoperability in specifying measurement pointVSAvoiddistance between X-ray source and sample

Core Design Contradiction:

Ease of operationVSLength of stationary object

Solution Approach 1:

The observation system is divided into two distinct systems: a first observation system with large field of view and deep depth of field for specifying measurement positions, and a second observation system with narrow field of view and small depth of field for precise distance measurement. This segmentation allows each system to be optimized for its specific function without compromise.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The first observation system acts as an intermediary that identifies and designates measurement positions on the sample surface, while the second observation system performs the actual precise distance measurement. This intermediary role allows the system to benefit from both large field of view for positioning and small depth of field for precision.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Ease of operation

If optical system with large field of view is used, then ease of operation in specifying measurement position is improved, but measurement precision of distance decreases

Engineering Contradiction:

Improveease of operation in specifying measurement positionVSAvoidprecision of distance measurement

Core Design Contradiction:

Ease of operationVSMeasurement precision

Solution Approach 1:

The observation system is divided into two distinct systems: a first observation system with large field of view and deep depth of field for specifying measurement positions, and a second observation system with narrow field of view and small depth of field for precise distance measurement. This segmentation allows each system to be optimized for its specific function without compromise.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

Different parts of the observation system have different optical characteristics optimized for their specific functions. The first observation system has large field of view and deep depth of field for easy positioning, while the second observation system has narrow field of view and small depth of field for high precision measurement.

Inventive Principle:

Principle #3Local quality

3Measurement precision

If optical system with small depth of field is used for distance measurement, then measurement precision is improved, but operability in specifying measurement position deteriorates

Engineering Contradiction:

Improveprecision of distance measurementVSAvoidoperability in specifying measurement position

Core Design Contradiction:

Measurement precisionVSEase of operation

Solution Approach 1:

The observation system is divided into two distinct systems: a first observation system with large field of view and deep depth of field for specifying measurement positions, and a second observation system with narrow field of view and small depth of field for precise distance measurement. This segmentation allows each system to be optimized for its specific function without compromise.

Inventive Principle:

Principle #1Segmentation

Solution Approach 2:

The first observation system performs preliminary action by identifying and designating measurement positions before the second observation system performs the actual precise distance measurement. This preliminary positioning action enables the second system to focus on high-precision measurement without needing to search for measurement positions.

Inventive Principle:

Principle #10Preliminary action

4Reliability

If X-ray source is brought closer to sample to improve sensitivity, then sensitivity is improved, but distance measurement becomes more difficult

Engineering Contradiction:

Improvesensitivity of X-ray analysisVSAvoidease of distance measurement

Core Design Contradiction:

ReliabilityVSEase of operation

Solution Approach 1:

The first observation system acts as an intermediary that identifies and designates measurement positions on the sample surface, while the second observation system performs the actual precise distance measurement. This intermediary role allows the system to benefit from both large field of view for positioning and small depth of field for precision.

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent replaces manual mechanical measurement methods with optical observation systems for distance measurement. The second observation system uses optical focus adjustment to measure distances with high precision, eliminating the need for complex mechanical measurement apparatus.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances operability and precision in specifying measurement points and measuring distances, enabling more accurate quantitative analysis while improving sensitivity by allowing a smaller optical component to be used, thus reducing the distance between the X-ray source and the sample.

Implementation Method 1

an X-ray emitted from an X-ray source is irradiated onto a sample, a fluorescent X-ray which is a characteristic X-ray emitted from the sample is detected

Methodology Applied

Scientific EffectX-ray emission: X-Ray

Implementation Method 2

fluorescent X-ray analysis, an X-ray emitted from an X-ray source is irradiated onto a sample, a fluorescent X-ray which is a characteristic X-ray emitted from the sample

Methodology Applied

Scientific EffectFluorescence: Fluorescence

Implementation Method 3

a second observation system which has a smaller depth of field than the first observation system, optically observes a narrow region, and measures the distance from the determined irradiation point by focus adjustment

Methodology Applied

Scientific EffectFocus adjustment: Focusing

Data Source

PatentUS8000439B2X-ray analyzer and X-ray analysis method

Publication Date: 2011.08.16 HITACHI HIGH TECH ANALYSIS CORP

AI summary

An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information of the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a first observation system which optically observes a surface of the sample in order to determine the irradiation point, and a second observation system which has a smaller depth of field than the first observation system, optically observes a narrow region, and measures the distance from the determined irradiation point by focus adjustment are included.