X-ray Analyzer Dual Laser Beam Alignment
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Solution Overview
Problem
Operators face difficulties in accurately determining the height position of a sample relative to the focal position of a primary X-ray in existing X-ray fluorescence analysis systems, leading to degraded operability and the need for indirect viewing methods.
Innovation Solution
An X-ray analyzer is designed with a sample stage, an X-ray source, a detector, a position adjustment mechanism, a first light source emitting a first light beam at a specific angle, and a second light source emitting a second light beam at a different angle, allowing for direct visual distinction between the two beams to facilitate easy alignment of the sample with the focal position.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If a single laser beam is used for position alignment, then the alignment process is simplified, but the operator cannot easily discriminate whether the sample height position is near or far from the focal position
Solution Approach 1:
The single laser beam is segmented into two separate laser beams (first laser beam and second laser beam) that are irradiated at different angles. This segmentation allows the operator to visually distinguish between the two beams and determine the sample's height position relative to the focal position, resolving the contradiction between simplified alignment and accurate height discrimination.
Solution Approach 2:
The two laser beams are irradiated at asymmetric angles relative to the sample surface. The first laser beam is irradiated at a first angle and the second laser beam at a second angle that is different from the first angle. This asymmetric configuration creates distinct visual patterns that enable the operator to discriminate whether the sample is above or below the focal position.
2Measurement precision
If indirect viewing methods are used to determine height position, then measurement precision is improved, but operability is degraded
Solution Approach 1:
The two laser beams act as intermediaries that provide visual information about the sample's height position directly to the operator. By irradiating the sample with two laser beams at different angles, the system creates visible reference marks that allow direct viewing and immediate discrimination of height position, eliminating the need for indirect viewing methods while maintaining precision.
3Adaptability or versatility
If rough adjustment of height is performed, then alignment flexibility is improved, but the operator still cannot easily discriminate height position
Solution Approach 1:
The system uses optical contrast (analogous to color changes) by irradiating the sample with two laser beams at different angles, creating distinct visual patterns that stand out against the sample background. This visual differentiation allows the operator to easily discriminate height position even during rough adjustment, maintaining both flexibility and detectability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables straightforward discrimination between the sample's height position being near or far from the focal position, improving operability by allowing direct viewing and precise position adjustments, thus enhancing the alignment process.
Implementation Method 1
a first light source configured to emit a first light beam at a second angle toward a focal position of the primary X-ray or toward a predetermined position which is apart from the focal position at a predetermined distance and at the same height as the focal position in a horizontal direction
Implementation Method 2
a second light source configured to emit a second light beam at a third angle toward the focal position or toward the predetermined position, the third angle being different from the first angle and the second angle
Implementation Method 3
an X-ray source configured to irradiate the sample with a primary X-ray at a first angle
Implementation Method 4
a detector configured to detect a secondary X-ray generated from the sample by being irradiated with the primary X-ray
Data Source
AI summary
An X-ray analyzer is provided with: a sample stage on which a sample is disposed; an X-ray source configured to irradiate the sample with a primary X-ray at a first angle; a detector configured to detect a secondary X-ray generated from the sample; a position adjustment mechanism configured to adjust a relative position between the sample stage and the primary X-ray; a first light source configured to emit a first light beam at a second angle toward a focal position of the primary X-ray or toward a predetermined position; and a second light source configured to emit a second light beam at a third angle toward the focal position or toward the predetermined position, wherein the first light beam and the second light beam are configured to have visibility sufficient for enabling visual distinction.