X-ray Analyzer Targeted Mapping Speed
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Solution Overview
Problem
X-ray mapping analysis for detecting harmful substances in composite electronic components is inefficient due to long measurement times, as existing methods often require scanning entire areas, including regions where measurement is not necessary, leading to unnecessary measurements and prolonged analysis times.
Innovation Solution
An X-ray analyzer with a sample stage and moving mechanism that allows for targeted measurement by designating only necessary regions for analysis, using a radial X-ray source, X-ray detector, image processing, and display to exclude non-measurement regions, enabling faster scanning and reducing unnecessary measurement time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the entire sample area is scanned for X-ray mapping analysis, then comprehensive elemental detection is achieved, but measurement time becomes excessively long
Solution Approach 1:
The patent divides the sample area into measurement regions and non-measurement regions based on component information. The sample stage is controlled to move only through measurement regions where harmful substances need to be detected, while skipping non-measurement regions. This segmentation approach maintains comprehensive elemental detection in necessary areas while eliminating unnecessary scanning time in areas where measurement is not required.
2Loss of time
If the sample stage moves at high speed across the entire sample area, then measurement time is reduced, but measurement precision deteriorates due to insufficient scanning in critical regions
Solution Approach 1:
The patent implements dynamic speed control of the sample stage based on the region type. The stage moves at high speed through non-measurement regions to minimize time loss, while slowing down appropriately in measurement regions to ensure sufficient scanning time for accurate elemental detection. This dynamic adjustment of movement speed resolves the contradiction between measurement time and measurement precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces measurement time by excluding unnecessary regions, allowing for efficient analysis of only targeted areas, thereby minimizing unnecessary scanning and enhancing the speed of elemental detection in X-ray mapping analysis.
Implementation Method 1
a radial ray source that irradiates an arbitrary irradiation point on the sample with a primary radial ray
Implementation Method 2
an X-ray detecting portion that detects a characteristic X-ray and a scattered X-ray radiated from the sample and outputs a signal including energy information
Data Source
AI summary
Provided is an X-ray analyzer that is capable of reducing measurement time necessary for mapping analysis by measuring only regions on a sample targeted by a measurer with minimal action. A superimposition process of a mapping image and image data of the sample is performed, and a position corresponding to an irradiation point is determined. Based on the result, the image is displayed, and measurement execution regions are designated on the displayed image and hence a sample moving mechanism moves at high speed in regions excluding the designated regions.