Interchangeable X-ray Anode Carousel for Non-destructive Depth Profiling
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Solution Overview
Problem
Traditional X-ray diffraction systems require destructive methods like machining or etching to obtain below-surface measurements, limiting their ability to perform non-destructive assessments at different depths in crystalline materials.
Innovation Solution
An X-ray diffraction system with a carousel mechanism that allows interchangeable x-ray generating tubes of different materials (e.g., copper, silver, chromium) and a multi-axis sample stage for adjusting the angle of incidence, enabling non-destructive measurements at various depths without surface alteration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If traditional X-ray diffraction systems use a single fixed X-ray source, then the system structure is simple, but it cannot perform non-destructive measurements at different depths
Solution Approach 1:
The patent implements multi-functionality by enabling a single X-ray source to perform multiple measurement functions at different depths through interchangeable anode materials. Each anode material (e.g., Cu, Mo, Ag) is selected based on the required penetration depth and measurement target, allowing the system to adapt to various crystallographic analysis requirements without requiring separate dedicated sources for each depth range
Solution Approach 2:
The system introduces dynamic configurability through the ability to interchange anode materials in the X-ray tube. The carousel mechanism with multiple anode options allows the system to dynamically adjust its characteristics based on the specific measurement requirements, transitioning from a static single-source design to a dynamic multi-configuration system
2Measurement precision
If traditional methods use machining or etching to access below-surface measurements, then depth measurement is achieved, but the sample is permanently destroyed
Solution Approach 1:
The patent applies parameter changes by varying the X-ray energy parameters through different anode materials to achieve different penetration depths. By selecting appropriate anode materials with specific atomic numbers and emission characteristics, the system can penetrate to desired depths and obtain crystallographic information from subsurface regions without physically altering or destroying the sample
3Adaptability or versatility
If multiple X-ray sources are used simultaneously to achieve different measurement depths, then depth versatility is improved, but the system becomes more complex and larger
Solution Approach 1:
The patent merges multiple potential X-ray sources into a single integrated system by providing one X-ray tube with interchangeable anode materials. This consolidation approach combines the functionality of multiple dedicated sources while maintaining a single physical source position, thereby achieving multi-depth measurement capability without proportionally increasing system complexity or size
4Adaptability or versatility
If interchangeable X-ray generating components are implemented, then non-destructive multi-depth measurement is enabled, but the device complexity increases
Solution Approach 1:
The system introduces dynamic configurability through the ability to interchange anode materials in the X-ray tube. The carousel mechanism with multiple anode options allows the system to dynamically adjust its characteristics based on the specific measurement requirements, transitioning from a static single-source design to a dynamic multi-configuration system
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables multiple crystallographic measurements at different depths within a single sample without damaging it, increasing efficiency and reducing costs compared to traditional methods.
Implementation Method 1
A first interchangeable x-ray generating component (104) of an x-ray source (102) is configured to emit a first x-ray beam (220) at a first energy and first wavelength
Implementation Method 2
a first diffracted beam (222) is then detected by a detector (213). After the first x-ray beam (220) at the first energy and the first wavelength is emitted
Data Source
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Figure 2~3
Figure 4
AI summary
An x-ray diffraction system (100) includes an x-ray source (102) having a first interchangeable x-ray generating component (104), a second interchangeable x-ray generating component (106), an actuator (108) and a controller (110) operatively connected to the actuator. The first and second interchangeable x-ray generating components (104, 106) are interchangeable with one another. The actuator (110) is operatively connected to the first and second interchangeable x-ray generating components (104, 106). A method for non-destructive x-ray diffraction includes emitting a first x-ray beam from an x-ray source with a first x-ray generating component based on a first desired depth to measure a crystallographic signature of a sample at the first desired depth, interchanging the first x-ray generating component (104) with a second x-ray generating component (106) to form a modified x-ray source, and emitting a second x-ray beam from the modified x-ray source based on a second desired depth, to non-destructively measure a crystallographic signature of the sample at the second desired depth.