X-ray Backscattering Screening for Foreign Substance Detection

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Solution Overview

Problem

Current methods for screening electronic equipment at airports for foreign substances, such as explosives or contraband, are inefficient due to high false rates and long processing times, especially when dealing with complex items like laptops and smartphones.

Innovation Solution

A method using a collimated X-ray beam to detect and measure energy spectra from objects, specifically analyzing Compton and Bremsstrahlung signals to determine the presence of foreign substances by comparing count rates to predetermined thresholds, allowing for rapid and accurate identification without the need for signal correction.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional X-ray imaging methods are used to screen electronic equipment, then the screening can be performed, but the false rate is high and processing time is long

Engineering Contradiction:
Improvefalse rateVSAvoidprocessing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent changes the measurement parameters by using backscattered X-ray detection at specific angles (120-170 degrees) and analyzing the energy spectrum parameters (Compton scattering signal, Bremsstrahlung spectrum, Rayleigh scattering signal) rather than conventional imaging parameters. This enables rapid quantitative analysis of foreign substances with high reliability and low false rates within 1-5 seconds per object.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If electronic equipment is manually inspected by opening and checking components, then hidden foreign substances can be detected, but the process is time-consuming and labor-intensive

Engineering Contradiction:
Improvedetection accuracyVSAvoidthroughput per unit time
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent replaces the mechanical manual inspection system with an automated X-ray backscattering measurement system. The device automatically directs collimated X-ray beams, detects backscattered radiation, and analyzes energy spectra to identify foreign substances, achieving both high detection accuracy and high throughput without manual intervention.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The system enables self-service screening where electronic equipment can be screened automatically without requiring personnel to open or manipulate the devices. The X-ray backscattering method inherently penetrates housings and detects foreign substances through the device structure itself.

Inventive Principle:
Principle #25Self-service

3Measurement precision

If signal correction is applied to detected X-ray signals, then measurement accuracy may be improved, but the complexity of the system increases

Engineering Contradiction:
Improvesignal accuracyVSAvoidsignal processing complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent converts the previously problematic background signal into a useful measurement resource. By analyzing the energy spectrum of backscattered X-rays including Compton scattering, Bremsstrahlung, and Rayleigh scattering components, the system directly uses these signals to identify foreign substances through their characteristic spectral signatures, eliminating the need for complex correction algorithms.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables a fast and reliable screening process with low false rates and high throughput, capable of detecting even hidden or tampered-with substances within seconds, suitable for airport security and other applications.

Implementation Method 1

detecting and measuring an energy spectrum resulting from X-ray scattering of energy from the object, comprising the Compton scattering signal

Methodology Applied
Scientific EffectCompton scattering: Compton Scattering

Implementation Method 2

comprising the Rayleigh scattering signal

Methodology Applied
Scientific EffectRayleigh scattering: Rayleigh Scattering

Implementation Method 3

comprising the Bremsstrahlungsspectrum

Methodology Applied
Scientific EffectBremsstrahlung:

Data Source

PatentEP2743687B1Method and device for screening objects for the presence of foreign substances
Publication Date: 2020.03.18 DT SOLUTIONS BV
  • EP2743687B1 patent drawingFigure 1
  • EP2743687B1 patent drawingFigure 2

AI summary

The present invention relates to a method and a device for screening an object, such as electronic equipment, for the presence of foreign substances. According to the state of the art a collimated X-ray beam is directed onto the object and X-ray energy scattered from the object is detected and measured. The method and device according to the invention further execute the following steps: Determining the number of counts corresponding to at least the integral inelastic part of the spectrum measured in step b); and Establishing the presence or absence of foreign substances based on evaluation of the number of counts determined in step c).