X-ray Imaging Calibration Parameter Segmentation
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Solution Overview
Problem
Current x-ray imaging systems face complexity in calibration processes due to fixed control parameters across different modes of operation, making it difficult to switch between modes and requiring intricate programming, especially when machine movements and x-ray techniques differ.
Innovation Solution
An x-ray imaging system with a control device that defines and carries out calibration processes by separating control parameters related to the flat-panel detector from those unrelated, allowing independent settings for each mode of operation, eliminating machine movements during calibration and standardizing the x-ray technique as a two-point technique.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If calibration processes simulate each mode of operation in detail with fixed control parameters, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent segments control parameters into two distinct groups: parameters related to flat-panel detector functioning and parameters not related to detector functioning. This segmentation allows the calibration process to fix only the detector-related parameters while leaving other parameters variable, thereby reducing calibration complexity while maintaining precision for detector characterization.
Solution Approach 2:
The patent creates a universal calibration approach where a single calibration process can be used across multiple modes of operation (fluoroscopy, radiography, hybrid mode, tomography). By fixing only detector-related parameters and allowing mode-specific parameters to remain variable, the same calibration data serves all modes, reducing the number of separate calibration procedures needed.
2Adaptability or versatility
If different modes of operation use different fixed control parameters, then adaptability is improved, but ease of operation deteriorates
Solution Approach 1:
By separating control parameters into detector-related and non-detector-related categories, the system allows automatic adaptation to different modes without requiring manual reconfiguration of detector parameters during calibration. The control device automatically handles mode-specific parameters while keeping detector calibration parameters consistent across modes.
3Measurement precision
If machine movements are included in calibration processes for each mode, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The patent extracts machine movement parameters from the calibration process by fixing only detector-related control parameters during calibration. Since detector inhomogeneities are independent of machine movement and mode-specific settings, the calibration can be performed without executing machine movements, significantly reducing calibration time while maintaining accuracy for detector characterization.
4Adaptability or versatility
If intricate programming is required for calibration across different modes, then adaptability is improved, but ease of manufacture deteriorates
Solution Approach 1:
The patent simplifies programming by segmenting the calibration approach: a single standardized calibration routine fixes detector-related parameters, while mode-specific parameters are handled separately by the control device. This eliminates the need for complex mode-specific calibration programming while maintaining full adaptability across fluoroscopy, radiography, hybrid mode, and tomography.
Solution Approach 2:
The invention implements a universal calibration procedure that works across all operating modes. By fixing only detector-related parameters and allowing mode-specific parameters to remain variable, the same calibration software and process can be used for all modes, significantly reducing programming complexity and making the system easier to manufacture and maintain.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Simplifies the calibration process, enabling economic production and operation by decoupling control parameters, allowing for flexible mode transitions without machine movements and consistent x-ray technique, thus streamlining the calibration process across various modes.
Implementation Method 1
Flat-panel x-ray detectors usually comprise a semiconductor with a scintillator located above it
Implementation Method 2
Flat-panel x-ray detectors usually comprise a semiconductor with a scintillator located above it
Data Source
AI summary
X-ray imaging systems can have different modes of operation. There is a calibration process for each mode of operation. Conventionally, the overall system is actuated during the calibration process in exactly the same way as when operating the x-ray imaging system (10) with the associated mode of operation. Individual calibration processes are now restricted to fixing a flat-panel parameter set which matches the mode of operation and by which the flat-panel detector (12) is actuated. However, the remaining system (14) does not have to be actuated depending on the mode of operation associated with the calibration process. A fixed system parameter set which is independent of the mode of operation is sufficient. It has been proven to be sufficient if no machine movements are carried out during all calibration processes, the x-ray radiation generator operates in the two-point technique and a series of images is recorded.

